A single-board dual-channel ft mass production test and yield analysis system and method

Abstract

The invention discloses a single-board double-channel product testing and yield analysis system which comprises the components of a man-machine interface processing module, a contact resistance testing module, a mobile data storage module, a hardware updating module, a handler control module, a power control and voltage calibrating module, an analog index testing module, a yield analysis module and an LCD display module, wherein the man-machine interface processing module, the contact resistance testing module, the mobile data storage module, the hardware updating module, the handler control module, the power control and voltage calibrating module, the analog index testing module and the yield analysis module are integrated in an embedded microprocessor. The single-board double-channel product testing and yield analysis system have advantages of reducing testing cost, realizing a product testing requirement, automatically making a yield control line according to multiple batches of testing result, improving testing accuracy, reducing data inaccuracy caused by a contact problem, and greatly improving efficiency.

Description

Technical field [0001] The invention belongs to the technical field of testing, and in particular relates to systems and methods for chip simulation performance detection, data statistics and analysis, and customer generation programming. Background technique [0002] The existing single-board mass production test device cannot perform integrated testing of multiple analog indicators such as voltage, current, clock frequency, and pull-up and pull-down resistance. The flexibility is poor and the investment is high. The device cannot save the yield of the tested chip in real time. The subsequent yield analysis work brings difficulties, and there is no contact resistance detection. The voltage and current signal test, ADC test and power supply voltage generation are all independent and can only be applied to a single type of chip test and the test of different types of items. The test platform needs to be re-developed, the versatility is poor, and new test devices cannot be develope...

AI Technical Summary

Problems solved by technology

[0002] At present, the existing single-board mass-production test device cannot perform integrated tests on multiple analog indicators such as voltage and current, clock frequency, and pull-up and pull-down resistance. The flexibility is poor and the investment is high. The subsequent yield analysis brings difficulties, and there is no contact resistance detection, voltage and current semaphore test, ADC test and power supply voltage generation are all independent, and can only be applied to a single type of chip test, and tests of different types of projects It is necessary to re-develop the test platform, which has poor versatility and cannot quickly develop new test devices. The external signal line impedance, contact and other problems of the external ADC input signal lead to unreliable data, heavy repetitive workload, and chip failure due to DC characteristics. The testing equipment does not have a complete testing method and cannot perform yield analysis at the same time. Due to problems such as false contact between the chip and the handler, the test results will be misjudged, which will cause cost losses. In order to solve the yield problem, the test engineer It takes a lot of time to analyze the problem, and the whole process requires human participation. A lot of repetitive work increases the cost of manpower, material and time resources. Large internal friction leads to high testing costs, and subsequent maintainability becomes more difficult. Traditional yield analysis The method is restricted by actual conditions, and only analyzes and judges a single batch of chip products. In the case of large batch changes, the formulation of yield control lines is not accurate; due to the influence of traditional development ideas, there is a lack of highly integrated testing and testing. Yield analysis device restricts the efficiency of FT mass production test

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