Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Multi-precision anti-radiation logic control device for SAR-type ADC

A logic control and anti-irradiation technology, which is applied in the field of ADC logic control, can solve the problems of lack of anti-irradiation performance, low compatibility, and restrictions on the application environment of ADC chips, so as to enhance the ability of anti-irradiation and reduce misjudgment. Probability, the effect of ensuring data stability

Active Publication Date: 2018-07-03
XIAN MICROELECTRONICS TECH INST
View PDF6 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Most of the existing ADC logic control technologies are only for a specific product, have low compatibility, and do not have anti-radiation performance, which greatly limits the application environment of ADC chips

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-precision anti-radiation logic control device for SAR-type ADC
  • Multi-precision anti-radiation logic control device for SAR-type ADC
  • Multi-precision anti-radiation logic control device for SAR-type ADC

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0023] The invention provides a multi-precision anti-irradiation logic control device for SAR ADC, such as figure 1 As shown, it includes an input register circuit 2 , a sampling counter 3 , an internal clock generator 4 , a capacitor control switch 5 , an intermediate result register 6 , a register conversion module 7 and a control logic module 1 .

[0024] Working principle among the present invention and the working process of each part are specifically:

[0025] The input register 2 is used to classify and latch serial input data, complete the storage of external configuration information and generate configuration control signals. The input register 2 is a shift register structure, the number of registers is determined by the number of channels and configuration requirements, and can be configured according to di...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a multi-precision anti-radiation logic control device for an SAR-type ADC, which comprises an input register, a sampling counter, an inner clock generator, a capacitor controlswitch, an intermediate result register, a register conversion module and a control logic module, wherein the input register is used for writing external configuration and generating control signals for internal configuration; the sampling counter generates stage control signals and format control signals; the inner clock generator generates effective internal clock signals in a conversion stage;the capacitor control switch generates sampling / holding control switch signals for a capacitance array; the intermediate result register is used for storing an AD conversion result; the register conversion module parallelly stores the AD conversion result, and final serial output is completed; and the control logic module is used for realizing logic control on the above components to enable a sampling stage and an internal conversion state to perform time sharing processing. The device can be applied to an ADC circuit in multiple application environments and has the advantages of small area, low power consumption and strong extensibility.

Description

technical field [0001] The invention belongs to the technical field of ADC logic control; in particular, it relates to a multi-precision anti-irradiation logic control device for SAR ADC. Background technique [0002] In the past few decades, integrated circuits have developed rapidly at an astonishing speed, and the degree of digitization has continued to deepen, and the requirements for analog-to-digital conversion technology (ADC) in the system have also become higher and higher. The analog-to-digital converter not only needs to have a high sampling rate and quantization accuracy, but at the same time, as the power supply voltage continues to decrease, the chip area is getting smaller and smaller, and the ADC must also have a high conversion efficiency and low power consumption. The past high-speed ADC design was mainly based on the pipeline structure, and the disadvantages of large pipeline structure area and high power consumption are increasingly unable to meet the sys...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H03M1/46
CPCH03M1/462
Inventor 张先娆郭仲杰李婷
Owner XIAN MICROELECTRONICS TECH INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products