Three-dimensional measurement method and device based on Hilbert transform phase error correction

A three-dimensional measurement and phase error technology, applied in measurement devices, optical devices, instruments, etc., can solve problems such as Hilbert transform error, and achieve the effect that is conducive to correct calculation

Active Publication Date: 2020-07-21
SHENZHEN ESUN DISPLAY +1
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Problems solved by technology

[0007] Based on this, it is necessary to provide an adaptive correction method that can reduce the phase error caused by the nonlinearity of the system, and solve the serious error of the Hilbert transform due to frequency aliasing and boundary effects. Three-dimensional measurement method, device, computer equipment and storage medium for phase error correction of Halbert transform

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  • Three-dimensional measurement method and device based on Hilbert transform phase error correction
  • Three-dimensional measurement method and device based on Hilbert transform phase error correction
  • Three-dimensional measurement method and device based on Hilbert transform phase error correction

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[0032] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0033] A three-dimensional measurement method based on Hilbert transform phase error correction, such as figure 1 shown, including the following steps:

[0034] S102. Collect N-step phase-shifted fringe images of the measured object.

[0035] In the 3D reconstruction system, optical phase measurement profilometry is often used to measure the 3D profile of the object surface. Optical phase measurement profilometry is an optical three-dimensional surface shape measurement technology based on grating projection and phase measurement, which can effectively realize the automatic measureme...

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Abstract

The invention relates to a three-dimensional measurement method, a device, a computer equipment and a storage medium based on Hilbert transform phase error correction. The method comprises the following steps of: acquiring an N-step phase shift fringe image of an object to be measured; solving the airspace folding phase of each N-step phase shift fringe image based on the least square method; inverting N-step phase shift fringe signals according to the airspace folding phase; performing Hilbert transformation on the N-step phase shift fringe signal to calculate the Hilbert domain phase; obtaining three-dimensional data information of the detected feature based on the Hilbert domain phase. According to the method, the Hilbert transform is performed according to the N-step phase shift fringesignal obtained in the spatial domain folding phase inversion and the Hilbert domain phase is obtained. On the one hand, the influence of the amplitude modulation signal on the Hilbert transform is eliminated; On the other hand, it can reduce the phase error caused by the nonlinear response of the system. In addition, the stripe boundary continuation algorithm proposed in this paper can effectively solve the boundary effect problem caused by the non-integer periodic fringe on Hilbert transform.

Description

technical field [0001] The present application relates to the technical field of optical three-dimensional digital imaging, in particular to a three-dimensional measurement method, device, computer equipment and storage medium based on Hilbert transform phase error correction. Background technique [0002] In the 3D reconstruction system, optical phase measurement profilometry is often used to measure the 3D profile of the object surface. Optical phase measurement profilometry is an optical three-dimensional surface shape measurement technology based on grating projection and phase measurement, which can effectively realize the automatic measurement of the phase of the three-dimensional contour of the object surface. This method adopts structured light illumination, projects the sinusoidal grating image onto the surface of the object to be measured, uses a CCD camera at a certain angle to the projection direction to collect the deformed grating image modulated by the surface...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 陈海龙彭翔刘晓利徐文宇蔡泽伟何懂
Owner SHENZHEN ESUN DISPLAY
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