Surface nano-structure magnetic measuring device

Abstract

The invention relates to an electromagnetic detecting device in the field of optical technology measurement, and provides a surface nano-structure magnetic measuring device. The surface nano-structuremagnetic measuring device comprises a laser device, a delayer, a 1 / 4 wave plate, a concave lens, a convex lens I, a plane mirror, a polaroid, a beam splitter, a convex lens II, a lens table, an atomic force microscope I, a probe I, a lens seat, an objective lens, a sample, a Hall plate, a sample table, a signal generator, an oscilloscope, a detector, a magnet, a pre-amplifier, a differential amplifier, a compensator, an analog-digital converter, a computer, an atomic force microscope II and a probe II, the probe I and the probe II are atomic force microscope probes with the same overall dimension, the appearances of the probe I and the probe II are circular truncated cones, the probe I is provided with a through hole in the axis direction of the circular truncated cone, a wedge-shaped block is cut off on one side of a diagonal axis through a point, which is the closest to the forward direction of an x axis, on the periphery of the bottom surface of the circular truncated cone of the probe I, an oblique plane is formed on the bottom surface of the probe I, a five-degree angle is formed between the oblique plane and the horizontal plane, and a magnetic is formed by connecting four secondary magnets which are the same.

Description

technical field [0001] The invention relates to an electromagnetic detection device in the field of optical technology measurement, in particular to a low-cost surface nanostructure magnetic measurement device based on a loop measurement method. Background technique [0002] The magneto-optical Kerr effect measurement device is an important means in the study of material surface magnetism. Its working principle is based on the magneto-optic Kerr effect caused by the interaction between light and magnetized media. Magnetic detection, and non-contact measurement can be realized, and it has important applications in the research of magnetic order, magnetic anisotropy, interlayer coupling and phase transition behavior of magnetic ultrathin films. The magneto-optical Kerr effect measurement device mainly detects the magnetization observation of the sample surface by detecting the change of the polarization state of a beam of linearly polarized light after it is reflected on the s...

AI Technical Summary

Problems solved by technology

The magneto-optical Kerr effect measurement device mainly detects the magnetization observation of the sample surface by detecting the change of the polarization state of a beam of linearly polarized light after it is reflected on the surface of the material. Therefore, the imaging effect is easily limited by the optical elements. Technical defect one: The spatial resolution of the traditional focusing Kerr microscope using microscope objective lens is determined by the optical diffraction limit, so it is impossible to obtain the dynamic characteristics of magnetization at the nanometer scale; existing technical defect two: the device based on the phase-sensitive detection method is relatively Complicated and expensive, the magnetic measurement device with surface nanostructures can solve the problem

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