Unlock instant, AI-driven research and patent intelligence for your innovation.

A kind of deep and shallow trench semiconductor power device and preparation method thereof

A power device and semiconductor technology, applied in the field of deep and shallow trench semiconductor power devices and their preparation, can solve the problems of reducing the space of the epitaxial layer, not being optimized, and failing to fully exert the effect of the field plate, so as to increase the performance-price ratio, The effect of saving chip area

Active Publication Date: 2021-07-27
莫斯飞特半导体股份有限公司
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although this device structure is better than the general standard UMOS, it is not optimized, and the disadvantage is that there is only one (parametric) field plate, which is simple in design and process, but the efficacy of the field plate cannot be fully realized. To play, too much chip space is used as a field plate, reducing the space available for the epitaxial layer to conduct

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A kind of deep and shallow trench semiconductor power device and preparation method thereof
  • A kind of deep and shallow trench semiconductor power device and preparation method thereof
  • A kind of deep and shallow trench semiconductor power device and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0111] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0112] The deep and shallow trench semiconductor power device of the present invention is different from the existing design which only adopts one trench depth, but uses more than one trench depth device structure, and has many different design schemes.

[0113] Option One:

[0114]The deep and shallow trench semiconductor power device of this solution has at least trenches of more than one depth. In this embodiment, trenches of two different depths (deep trenches and shallow trenches) are used, wherein the bottom of the deep trenches has The field plate of the deep trench is mainly used to adjust the electric field distribution. The top of the deep trench is used a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

A deep and shallow trench semiconductor power device, including a P-shaped base region, an N+ source region, a terminal region, a source metal pad layer, and a gate metal pad layer, with at least two trenches of different depths, passing through the P-type The base region enters the epitaxial layer; among them, a trench with a depth, its side wall and bottom wall are dielectric layers, and the middle is a conductive material, and the formed conductor is connected to the gate metal and used as the gate of the device; the other A trench with a depth of two parts: an upper part of the trench and a lower part of the trench: the side wall and bottom wall of the lower part of the trench are dielectric layers, and the middle is a conductive material, and the formed conductor is connected to The metal in the source region is used as a field plate; the sidewall and bottom wall of the upper part of the trench are dielectric layers, and the middle is a conductive material. The conductor is connected to the gate metal and used as the gate of the device. In the semiconductor power device of the present invention, deep and shallow field plates are combined to optimize the function of the field plate, save chip area, and increase the performance-price ratio of the device.

Description

technical field [0001] The invention relates to the technical field of semiconductor power devices, in particular to a deep and shallow trench semiconductor power device and a preparation method thereof. Background technique [0002] The power gate field effect transistor (POWER MOSFET) is a unipolar carrier type device, which is easy to control. Compared with bipolar transistors, the control switch requires only very low power, and due to the low on-resistance and high-speed switching , so it can effectively control high frequency and large current. At present, power MOSFETs have been widely used in various electronic and communication products, such as power amplifiers, power converters, low-noise amplifiers, and power supply switches and power circuits of some personal computers. There are also various applications in industry. [0003] As a switching device is used, the losses associated with the device during application can be divided into conduction loss and switchi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/78H01L21/336H01L29/06H01L29/423
CPCH01L29/0603H01L29/0684H01L29/4236H01L29/66477H01L29/78
Inventor 欧阳伟伦梁安杰罗文健
Owner 莫斯飞特半导体股份有限公司