Method and device for fast measurement of keyboard keycap flatness based on structured light imaging

A technology of structured light imaging and measurement methods, applied in measurement devices, optical devices, instruments, etc., can solve the problems of high equipment cost and maintenance cost, low detection accuracy, slow detection speed, etc., to solve the problems of physical installation and mobile The effect of error, high detection accuracy and convenient switching

Active Publication Date: 2020-07-10
HUNAN UNIV
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  • Application Information

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Problems solved by technology

[0003] If manual detection is used, its subjectivity is strong, the error is large, and the efficiency is low
[0004] At present, there are four technical solutions to realize automatic measurement of keycap flatness: (1) measuring probe measurement method, which has high precision and does not need to move the sensor, but the disadvantage is high equipment cost and maintenance cost; (2) three-dimensional visual measurement method, Its detection accuracy is high, but the biggest disadvantage is that it needs to move the three-dimensional sensor, and the detection speed is slow; (3) the laser rangefinder measurement method, this method also needs to move the sensor, physical installation is a problem, its detection speed is slow, and there is a displacement error; ( 4) The machine vision measurement method of the area array camera has the advantage of low cost, but low detection accuracy

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  • Method and device for fast measurement of keyboard keycap flatness based on structured light imaging
  • Method and device for fast measurement of keyboard keycap flatness based on structured light imaging
  • Method and device for fast measurement of keyboard keycap flatness based on structured light imaging

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Embodiment Construction

[0060] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0061] Such as Figure 1 to Figure 4 As shown, the keyboard keycap flatness fast measurement method based on structured light imaging of the present invention, its steps are:

[0062] Step S1: Structured light mode design and projection, to ensure that the structured light generated by the digital projector has a clear light stripe on the upper and lower ends of each keycap surface of the keyboard to be tested;

[0063] Step S2: Multiple cameras collect image sequences; after receiving the detection signal, the cameras collect keyboard image sequences encoded by structured light;

[0064] Step S3: image stitching; stitching the image sequence into a complete full-size keyboard image with high resolution;

[0065] Step S4: Keycap modeling; relying on manual acquisition of the keycap mask and the position information of each keycap in...

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Abstract

The invention relates to a method and device for rapidly measuring the flatness of keyboard key caps based on structured light imaging. The method comprises the steps that S1, a structured light modeis designed, projection is carried out, and generated structured light forms two clear light stripes at the upper and lower ends of each keyboard key cap of a to-be-detected keyboard respectively; S2,multiple cameras acquire image sequences, wherein after a detection signal is received, the cameras collect the keyboard image sequences which are encoded by the structured light; S3, an image is spliced, wherein the image sequences are spliced to form the complete full-scale keyboard image; S4, the key caps are subjected to modeling, wherein key cap masks and position information of each key capin the keyboard image are obtained manually; S5, the flatness of each keyboard key cap can be rapidly detected by utilizing a flatness algorithm detection algorithm. The device is used for implementing the method. The device has the advantages of being high in automation degree, high in detection efficiency, easy to implement, easy to maintain and the like.

Description

technical field [0001] The invention mainly relates to the technical field of machine vision, in particular to a method and device for quickly measuring the flatness of a computer keyboard keycap. Background technique [0002] The keyboard is an electronic product commonly used in daily life, and it is also a bridge for human-computer interaction. A general keyboard is inlaid with hundreds of keys, and the key cap of each key is the main contact part of the user. Once the key cap is uneven, it will affect the comfort and smoothness of the user's keystrokes. Therefore, in the production process of the keyboard, it is necessary to detect the flatness of the keyboard keycap. [0003] If manual detection is used, it has strong subjectivity, large errors and low efficiency. [0004] At present, there are four technical solutions to realize automatic measurement of keycap flatness: (1) measuring probe measurement method, which has high precision and does not need to move the sen...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/30
CPCG01B11/303
Inventor 肖昌炎缪慧司周苹谭立春张可惠
Owner HUNAN UNIV
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