Method for preparing Mo-doped Al2O3 high-resistance film by atomic layer deposition
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
- Publication Date
- 2018-09-28
- Estimated Expiration
- Not applicable · inactive patent
Smart Images

Figure 1 
Figure 2 
Figure 3
Abstract
Description
technical field
[0001] The invention relates to a method for preparing a high-resistance thin film in the field of optoelectronic materials, in particular to a method for preparing Mo-doped Al by atomic layer deposition 2 o 3 High resistance film method. Background technique
[0002] Since the 1980s, thin-film technology and thin-film materials have developed rapidly, and have achieved fruitful results in both academic and engineering applications, and have become one of the most active research fields in material science today. For a long time, the research hotspots of conductive thin films have focused on low-resistance thin films, especially the AZO thin films represented by Al-doped ZnO (aluminum-doped zinc oxide). There are few reports on the research of high-resistance thin films. Although by adjusting the Zn / Al ratio, the AZO film can also be prepared into a high-resistance film, but this AZO film has poor stability in a high-temperature working environment or afte...