Method for rapid imaging of absorption defect distribution on surface of large-diameter optical element
Patent Information
- Authority / Receiving Office
- CN ยท China
- Current Assignee / Owner
- UNIV OF ELECTRONIC SCI & TECH OF CHINA
- Publication Date
- 2019-03-08
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Abstract
Description
technical field
[0001] The invention relates to the field of optical component detection, in particular to a method for high-resolution, fast and non-destructive imaging detection of the surface and subsurface absorption defect distribution of large-diameter optical components. Background technique
[0002] Light absorption characteristics are an important index to measure the quality of optical components. For high-power laser systems, the characterization and control of the absorption loss distribution of optical components is particularly important, because the absorption center will lead to loss of laser energy, enhanced local temperature rise, degradation of beam quality, and even laser damage. Among the many causes of the above problems, surface and subsurface absorption defects of optical components are a major one. Surface and subsurface absorption defects are more common than bulk absorption defects. A lot of practice shows that the actual measured laser damage th...