Method for rapid imaging of absorption defect distribution on surface of large-diameter optical element

A technology of optical components and defect distribution, applied in the direction of optical testing defects/defects, material thermal development, etc., can solve the problems of extremely long time, lack of technical reality, discount of random characterization effect, etc., to achieve high sensitivity, high Spatial resolution, improving the effect of single detection area
CN109444166AActive Publication Date: 2019-03-08UNIV OF ELECTRONIC SCI & TECH OF CHINA

Patent Information

Authority / Receiving Office
CN ยท China
Current Assignee / Owner
UNIV OF ELECTRONIC SCI & TECH OF CHINA
Publication Date
2019-03-08

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Abstract

The invention discloses a method for rapid imaging of absorption defect distribution on the surface of a large-diameter optical element. The method comprises the following steps: carrying out collimation and beam expanding of high-energy pulse laser to form a large-size excitation light spot for radiation heating on an optical element, enabling absorption defects on the surface and the subsurfaceof the optical element to be at transient temperature distribution and refractive index distribution; after certain time delay, carrying out collimation and beam expanding of another beam of high-energy pulse laser to form a large-size detection light spot which penetrates through an identical area radiated by the optical element, and recording diffraction light field distribution of the light spot by using a CCD; controlling time delay between excitation and detection laser pulses and analyzing characteristics of diffraction light field images recorded by using the CCD, thereby confirming whether the radiated area of the optical element has absorption defects or not and corresponding characteristics. By adopting the method, advantages that a conventional optical-thermal lens technique ishigh in detection sensitivity, high in resolution ratio, and the like are retained, a single-time detection area can be greatly increased, and rapid detection on absorption defect distribution of large-diameter optical elements is achieved.
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Description

technical field

[0001] The invention relates to the field of optical component detection, in particular to a method for high-resolution, fast and non-destructive imaging detection of the surface and subsurface absorption defect distribution of large-diameter optical components. Background technique

[0002] Light absorption characteristics are an important index to measure the quality of optical components. For high-power laser systems, the characterization and control of the absorption loss distribution of optical components is particularly important, because the absorption center will lead to loss of laser energy, enhanced local temperature rise, degradation of beam quality, and even laser damage. Among the many causes of the above problems, surface and subsurface absorption defects of optical components are a major one. Surface and subsurface absorption defects are more common than bulk absorption defects. A lot of practice shows that the actual measured laser damage th...

Claims

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