Planar phased array-based two-dimensional beam scanning method
A beam scanning, plane phase technology, applied in the field of beam scanning, can solve the problems of unevenness and discrete scanning range, and achieve the effect of continuous scanning, improving diffraction efficiency, and simple and easy-to-understand model.
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[0030] The embodiments of the present invention will be described below in conjunction with the drawings. However, the following examples are limited to explaining the present invention.
[0031] A two-dimensional beam scanning method based on a planar phased array of the present invention, the specific steps are as follows:
[0032] Step one, establish as figure 1 In the plane phased array scanning model shown, θ is the scanning elevation angle, φ is the scanning azimuth, N is the number of elements in the x direction, M is the number of elements in the y direction, select N=M=200, the wavelength of the incident light wave Is 532.8nm, d x And d y Respectively represent the distance between the elements in the x direction and the y direction, both of which are taken as half the wavelength. The electric field intensity pattern at a specific point in the far field can be expressed as the product of the pattern in the x direction and the y direction. The expression is as follows:
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