Unlock instant, AI-driven research and patent intelligence for your innovation.

Multi-debugging mode circuit suitable for special processor and monitoring simulation method thereof

A technology of debugging mode and simulation method, applied in the direction of architecture, instrument, simulator, etc. with a single central processing unit, can solve the problems of no embedded simulation circuit, poor practical expansion, complicated circuit design, etc., to achieve simple circuit structure, The effect of meeting the requirements of RAM capacity and simulation speed and reducing the resource consumption rate

Active Publication Date: 2019-07-19
XI AN JIAOTONG UNIV
View PDF5 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The 16-bit processor is characterized by the use of RISC reduced instruction set architecture, which includes primary and secondary registers, has no special simulation structure, and does not have embedded simulation circuits, so it can only be implemented using ROM monitoring simulation technology based on custom development boards. Simulation, but the existing ROM monitoring simulation technology is based on the reference prototype design of a dedicated processor chip. In order to meet the needs of different debugging modes, the circuit design is more complicated, the implementation cost is high, and the practical scalability is poor.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-debugging mode circuit suitable for special processor and monitoring simulation method thereof
  • Multi-debugging mode circuit suitable for special processor and monitoring simulation method thereof
  • Multi-debugging mode circuit suitable for special processor and monitoring simulation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] Below in conjunction with accompanying drawing, the present invention is described in further detail:

[0032] refer to figure 1 , the processor adopts an improved Harvard structure, FLASH and SRAM respectively store instructions and data, the address bus and data bus are shared by the two memories in time-sharing, and the control bus (including chip select signal and read-write enable signal) controls the completion of the program or data Data transmission between the storage module and the CPU. In the specific design, the simulation monitoring circuit is implemented on the FPGA platform, and the FLASH and SRAM are replaced by instantiated RAM.

[0033] refer to figure 2 , the multi-debugging mode circuit and its monitoring simulation method suitable for special-purpose processors are realized based on a nested function state machine. The nested function state machine includes a main state machine circuit for command packet parsing and a program execution sub-state ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a multi-debugging mode circuit suitable for a special processor and a monitoring simulation method thereof which are achieved based on a nested function state machine during design. The circuit comprises a main state machine circuit for command packet analysis, a program execution sub-state machine circuit and a data feedback sub-state machine circuit, wherein the circuit has a simple structure and better practical expansibility. The program execution sub-state machine circuit integrates four debugging functions of single step execution, breakpoint execution, complete execution and register value monitoring together through an address determination circuit and a state machine instruction generation circuit, and achieves multiple debugging modes after key addresses in a command packet are analyzed; the data feedback sub-state machine circuit provides two data feedback modes according to the start-stop address of the memory recorded by the address monitoring circuit, and can meet different simulation requirements.

Description

technical field [0001] The invention belongs to the field of embedded system hardware, and in particular relates to a multi-debugging mode circuit suitable for a special processor and a monitoring simulation method thereof. Background technique [0002] There is a dedicated processor that adopts an improved Harvard structure, including two independent memory modules FLASH and SRAM, and an independent address bus and data bus. FLASH and SRAM respectively store instructions and data. When the processor is working, the two buses are time-shared by the program memory and the data memory. They are jointly controlled by the processor's memory chip select signal and the read-write enable signal. The two buses are accessed by using the common address bus memory, and the common data bus is used to complete the data transfer between the program memory or data memory and the CPU. [0003] For processor simulation, the existing simulation technologies mainly include five types: commerc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G05B17/02G06F15/78
CPCG05B17/02G06F15/78
Inventor 程军于鹤杰徐祗聪梅魁志李倩李亚飞常蕃张向楠
Owner XI AN JIAOTONG UNIV
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More