Testing circuit and testing method of equivalent noise charge of front-end readout integrated circuits

Abstract

The invention relates to a testing circuit and a testing method of equivalent noise charge of front-end readout integrated circuits. The testing method comprises the following steps: firstly, placinga front-end readout chip in a measurement system according to a relation between equivalent noise charge and detector capacitance of the front-end readout chip, and completing electrical test preparation; secondly, achieving different detector capacitance values by using the states of an FPGA control switch, measuring equivalent noise charge values under different capacitance values, and calculating equivalent noise slope through linear fitting; thirdly, breaking an input end bound wire and calculating an equivalent noise charge value under the condition of zero input capacitance; and finally,proposing a front-end readout integrated circuit equivalent noise charge formula obtained by testing. The method is capable of achieving full-automatic testing of equivalent noise charge parameters of the front-end readout integrated circuits, is suitable for testing large batches of front-end readout integrated circuits, is high in efficiency and low in cost, and has scientific guiding significance to performance evaluation of the front-end readout integrated circuits.

Description

technical field [0001] The invention belongs to an equivalent noise charge test circuit and a test method of a front-end readout integrated circuit, and relates to an FPGA-based test circuit for automatically testing the equivalent noise charge of an analog front-end readout integrated circuit. Background technique [0002] The front-end readout integrated circuit is the core electronic component of the semiconductor radiation detector system. The simplified schematic diagram of the analog front-end readout integrated circuit consisting of a charge-sensitive amplifier and a pulse-shaping amplifier is shown in figure 1 shown. Equivalent noise charge (ENC) is an important performance index for evaluating front-end readout integrated circuits, which is defined as: [0003] [0004] in, is the root mean square value of integrated noise of the front-end readout integrated circuit output voltage, A Q IC charge-voltage conversion gain for the front-end readout. The unit of...

AI Technical Summary

Problems solved by technology

[0014] Using this method to test ENC requires manual insertion and insertion of capacitors for each measurement. The operation is more complicated and the test efficiency is low. It is not suitable for testing large-scale front-end readout chips.

Moreover, multiple plugging and unplugging can cause damage to the contact points, resulting in random errors and inaccurate measurements

Images