Automatic fault injection method of EDIF netlist-level combinational logic circuit
A technology of combinational logic circuits and fault injection, which is used in the detection of faulty computer hardware, electrical digital data processing, instruments, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
specific Embodiment approach 1
[0022] Specific implementation mode one: the specific process of the automatic fault injection method of a kind of EDIF netlist level combinatorial logic circuit of this embodiment is:
[0023] The root cause of circuit failures is the physical defects in the manufacturing process, which show errors under certain incentive conditions, and eventually lead to system failure when the errors exceed a certain limit. Defect types include silicon wafer defects, photolithography defects, mask problems, process deviations and oxidation problems, such as large bubbles in materials, surface ions, irregular tilting or shape deformation of components or connecting lines, etc. Since there are many causes of physical failures and are related to the process, generally the physical failures are not studied directly, but the modeled logical failures are studied. Common logical fault models of integrated circuits include stuck-at faults, bridging faults, transient faults, and time-delay faults. ...
specific Embodiment approach 2
[0035] Specific embodiment two: the difference between this embodiment and specific embodiment one is that the original netlist file is traversed in the step one, and the original netlist file is preprocessed; the specific process is:
[0036] Extract all the network cables in the original netlist file, remove the initial input and output, and construct the network cable list $Nets, which is convenient for subsequent insertion of fault points.
[0037] Other steps and parameters are the same as those in Embodiment 1.
specific Embodiment approach 3
[0038]Specific embodiment 3: The difference between this embodiment and specific embodiment 1 or 2 is that in the step 3, forward traversal is performed according to the fault point, and the network cable corresponding to the fault point is deleted by reverse search to the input terminal of the logic gate The logic gate $toDel_Gate connected to $Net, and the logic gate associated with the network cable corresponding to the fault point (the logic gate in the fan-in area); the specific process is:
[0039] First find the logic gate $toDel_Gate whose output terminal is connected to the network cable $Net corresponding to the fault point, and then call the function Del_Gates($EDIF_str, $toDel_Gate) to delete the logic that the output terminal is only connected to the network cable $Net corresponding to the fault point Door.
[0040] Among them, the Del_Gates($EDIF_str, toDel_Gate) function is a recursive function, and its pseudocode is described as follows:
[0041]
[0042] T...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com



