Nondestructive measurement device and method for thickness of pearl layer
A technology of measuring device and measuring method, which is applied in the direction of measuring device, optical device, instrument, etc., can solve the problems of X-ray ionizing radiation damage, limited light penetration depth, and inability to measure pearl thickness, achieving high resolution, The effect of good penetration and effective thickness measurement
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[0021] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.
[0022] like figure 1 As shown, the non-destructive measurement device for the thickness of the pearl layer of the present invention is composed of a terahertz transceiver probe 1, a terahertz receiving probe 2, a terahertz time-domain spectroscopy system host 3, a pearl test platform 4, and the like.
[0023] Among them, the terahertz time-domain spectroscopy system host 3 is used to realize the terahertz time-domain waveform measurement function; the terahertz transmitting probe 1 is used to generate pulsed terahertz waves; the terahertz receiving probe 2 is used to detect terahertz time-domain waveform signals; The test platform 4 is used to place the pearl sample to be tested, and supports 360° rotation of the sample and micron-level adjustment of the three-dimensional position.
[0024] The measurement and placement method of the pearl sample: the ...
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