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A solid material permittivity sensor based on siw-csrr structure

A solid material, dielectric constant technology, applied in the direction of dielectric property measurement, instrument, measurement of electrical variables, etc., can solve the problem of low test accuracy, and achieve the effect of low sample preparation requirements, simple experimental process, and simple test.

Active Publication Date: 2021-06-04
CHONGQING UNIV OF POSTS & TELECOMM
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] In view of this, the purpose of the present invention is to provide a solid material permittivity sensor based on SIW-CSRR structure. The sensor utilizes the characteristics of SIW cavity, such as high quality factor, compact outline, low manufacturing cost, and easy processing, to realize a A compact waveguide structure, on this basis, loading the CSRR structure to the microwave circuit can effectively improve the sensitivity and selectivity of the microwave sensor, and overcome the shortcomings of the low test accuracy of the dielectric constant of solid substances in the prior art

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  • A solid material permittivity sensor based on siw-csrr structure
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Embodiment Construction

[0025] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0026] figure 1 The schematic diagram of the solid material dielectric constant sensor structure based on the SIW-CSRR structure provided by the present invention, as shown in the figure, the sensor includes a front microstrip line structure, a dielectric substrate in the middle and a back ground metal plate; the front microstrip structure is up and down Symmetrical structure, including input microstrip line as 50 ohm microstrip line and 50 ohm output microstrip line, line width 1.1mm, length 10mm, followed by coplanar waveguide structure, coplanar waveguide central conduction bandwidth 1.1mm, length 1.8 mm, the width of the transverse slit in the middle is 2.4mm; both sides of the dielectric substrate in the middle are metallized via holes, the diameter of the via hole is 1mm, the distance between adjacent via holes is 1.8mm, and the inner wa...

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Abstract

The invention relates to a solid material dielectric constant sensor based on a SIW-CSRR structure, belonging to the technical field of microwave sensors. The sensor includes a front microstrip line structure, a middle dielectric substrate and a back ground metal plate; the front microstrip line structure is a vertically symmetrical structure, including a 50 ohm input microstrip line and a 50 ohm output microstrip line, and a substrate integrated Waveguide and coplanar waveguide, the front microstrip line structure is converted through the substrate integrated waveguide-coplanar waveguide-microstrip line conversion structure, and is excited by the 50 ohm microstrip line, coplanar waveguide and substrate integrated waveguide; the middle Both sides of the dielectric substrate are metallized via holes; the back ground metal plate is loaded with three complementary split resonant rings with different opening directions through slotting. The invention has the advantages of high sensitivity and selectivity, high accuracy rate of dielectric constant test, simple test scheme, compact outline, low production cost, easy processing and the like.

Description

technical field [0001] The invention belongs to the technical field of microwave sensors, and relates to a solid material dielectric constant sensor based on a SIW-CSRR (Complementary Split-Ring Resonator-Substrate Integrated Waveguide, Complementary Split-Ring Resonator-Substrate Integrated Waveguide) structure. Background technique [0002] The dielectric constant is a physical parameter that characterizes the dielectric properties or polarization properties of dielectric materials. Accurate measurement of the dielectric constant of an object has an important impact on the loss judgment of the object material. The instruments used to measure the dielectric constant of objects on the market are relatively expensive. At present, resonant cavity method, transmission reflection method and free space method are mostly used to measure the relative permittivity of objects. Among them, the resonant cavity method has the highest precision, but it has higher requirements on the siz...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/26
CPCG01R27/2617G01R27/2664
Inventor 郝宏刚王德戌尹波罗伟阮巍王韫睿
Owner CHONGQING UNIV OF POSTS & TELECOMM
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