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X-ray single exposure imaging device and method based on light intensity transmission equation

A light intensity transmission equation and imaging device technology, applied in the direction of material analysis using radiation, can solve the problems that the refraction system cannot achieve focus imaging, etc., and achieve the effect of simple structure, low coherence requirements, and simple operation

Active Publication Date: 2021-11-05
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

In the X-ray band, due to the strong absorption of the material, the refraction system cannot achieve focused imaging

Method used

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  • X-ray single exposure imaging device and method based on light intensity transmission equation
  • X-ray single exposure imaging device and method based on light intensity transmission equation
  • X-ray single exposure imaging device and method based on light intensity transmission equation

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Embodiment

[0061] The first single focus photon sieve focusing lens 5 (as figure 2 shown) and the second single-focus photon sieve focusing lens 7 (as figure 2 Shown) the focal length is 30.00mm, bifocal photon sieve focusing lens 6 (such as image 3 shown) have focal lengths of 105.90mm and 94.72mm. Specifically realize the X-ray single-exposure imaging device based on the light intensity transmission equation: such as figure 1 As shown, it includes an X-ray source 1, a beam expander 2, a first three-dimensional translation stage 3 for placing the measured object 4, a first single focus photon sieve focusing lens 5, a double focus photon sieve focusing lens 6, a second single focus A photon sieve focusing lens 7, a second three-dimensional translation stage 8, a computer 10, and an X-ray detector 9 fixed on the second three-dimensional translation stage 8;

[0062] The light pulse emitted by the X-ray source 1 is expanded by the beam expander 2, and the expanded beam is used as an ...

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Abstract

An X-ray single-exposure imaging device and method based on the light intensity transmission equation, including an X-ray source, a beam expander, a first three-dimensional translation stage, a measured object, a first single-focus photon sieve focusing lens, and a double-focus photon sieve Focusing lens, second single-focus photon sieve focusing lens, second three-dimensional translation stage, X-ray detector and computer, the present invention can be used for imaging from X-ray to terahertz band; the imaging method is simple to operate with a single optical path, and only needs to record a single The intensity map can realize accurate reproduction of the phase image of the measured object in real time and online, especially suitable for imaging and observation of dynamic objects; the imaging method has low requirements for the coherence of the X-ray source, and the X-ray source can be a coherent X-ray source and Partially coherent X-ray source; it can quickly and accurately restore the phase image of the object by using the recorded intensity map, which can avoid multiple operations and improve the robustness of the imaging device.

Description

technical field [0001] The invention relates to a light intensity transmission equation, in particular to an X-ray single-exposure imaging device and an imaging method based on the phase recovery of the light intensity transmission equation. Background technique [0002] Phase recovery is an important technology in optical imaging and measurement, which has attracted much attention for its wide application prospects in the fields of microscopic imaging, damage detection and phase encryption. In the dynamic microscopic imaging of living cells, the phase visualization of phase recovery technology can realize effective label-free imaging; in the damage or defect detection of optical components, the phase recovery technology can extract the damage structure information at different depths layer by layer , to provide effective guidance for the repair and replacement of optical components; in optical encryption, phase recovery technology can realize a variety of optical image phas...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04
CPCG01N23/04
Inventor 张军勇张秀平张艳丽周申蕾朱健强
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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