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Photodiode breakdown voltage test

A photodiode and breakdown voltage technology, applied in the field of photoelectric sensors, can solve the problems that the breakdown voltage range of photodiodes exceeds the archive interval, and the aging of photodiodes is not considered.

Active Publication Date: 2019-11-22
HESAI TECH CO LTD
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Problems solved by technology

In addition, such a scheme does not take into account the aging of the photodiode
However, since the inconsistency of the breakdown voltage of the photodiode after power-on aging will be larger than that of the newly assembled photodiode, such a solution in the prior art may test the photodiode after aging (for example , repeat the aforementioned method of needle sticking test), but cannot overcome the problem that the breakdown voltage range of the aged photodiode exceeds the previously selected archiving interval

Method used

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Embodiment Construction

[0042] In the following, only some exemplary embodiments are briefly described. As those skilled in the art would realize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present disclosure. Accordingly, the drawings and descriptions are to be regarded as illustrative in nature and not restrictive.

[0043] The flowchart and block diagrams in the figures illustrate the architecture, functionality and operation of possible implementations of apparatuses, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagram may represent a module, program segment, or part of code that contains one or more logic functions for implementing predetermined Executable instructions for a function. It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order n...

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Abstract

The invention relates to an analog front-end circuit capable of testing a breakdown voltage of a photodiode, a method for testing the breakdown voltage of the photodiode and a receiving circuit for alaser radar. Under the control of a controller, a voltage at an anode of the photodiode is adjusted by a voltage-type DAC, and / or a reverse bias voltage of the photodiode of each channel is independently adjusted by adjusting a power supply voltage at a cathode of the photodiode, so the test of the breakdown voltage of the photodiode can be completed, and the photodiode can be adjusted to an optimal working voltage.

Description

technical field [0001] The present disclosure generally relates to the technical field of photoelectric sensors, and specifically relates to the testing of the breakdown voltage of photodiodes, in particular to an analog front-end circuit capable of testing the breakdown voltage of photodiodes, and a method for testing the breakdown voltage of photodiodes. A method and a receiving circuit for lidar. Background technique [0002] Avalanche photodiode (APD) is a P-N junction photodetection diode, which uses the avalanche multiplication effect of carriers to amplify the photoelectric signal to improve the detection sensitivity. After adding a higher reverse bias voltage (typically 100-200V in silicon materials), an internal current gain of about 100 can be obtained in the APD by using the ionization collision (avalanche breakdown) effect. Some silicon APDs adopt technologies such as doping that are different from traditional APDs, allowing higher voltages (>1500V) to be app...

Claims

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Application Information

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IPC IPC(8): G01R31/26G01S7/491
CPCG01R31/2635
Inventor 王陈銮向少卿
Owner HESAI TECH CO LTD
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