Observation aid for high-temperature laser scanning confocal microscope samples and using method thereof

Abstract

The invention discloses an observation aid for high-temperature laser scanning confocal microscope samples and a using method thereof. The aid comprises a seat body, bolts and a wafer sample, whereinthe seat body is cylindrical; a plurality of through threaded holes are circumferentially and uniformly formed in the seat body; the bolts are meshed in the threaded holes; the bolts are formed by topping and grinding traditional bolts; placing grooves are formed in the top surfaces of the bolts; and wafer samples are fixedly connected in the placing grooves. The using method comprises the steps of sample mounting, sampling grinding and sample observation. The observation aid has the following beneficial effects that the cylindrical seat body is easy to be handheld for polishing, so that the grinding and polishing of multiple wafer samples at one time are convenient and benefit is brought to improve the surface quality and flatness of the wafer samples; and the fingers are prevented from being in direct contact with the samples and the wafer samples are easier to be uniformly stressed in the grinding process, so that the thickness uniformity of the samples is ensured. The aid is capable of observing the surface grinding corrosion conditions of multiple samples at the same time under a high-temperature laser confocal room-temperature microscope.

Description

technical field [0001] The invention relates to the technical field of high-temperature laser confocal microscopy, in particular to an observation aid for high-temperature laser confocal samples and a method for using it. Background technique [0002] The high-temperature laser confocal microscope can observe the whole heating process of the metal sample dynamically in real time, and can observe the melting, phase transition and grain boundary change of the sample in situ. The advantages of the high-temperature laser confocal microscope mainly include the following aspects: (1) The scanning imaging is fast, and high-speed and high-resolution scanning imaging can also be performed on high-temperature samples, and the observation window of the sample will not be damaged by volatiles produced by the sample due to temperature changes. pollute. (2) In the field of metal material experiments, a wide range of temperature heating can be achieved, and the cleanliness of samples at h...

AI Technical Summary

Problems solved by technology

In order to achieve the best sample observation surface, cumbersome and complicated sandpaper polishing process is often required

[0004] Due to the small size of the sample of the high-temperature laser confocal microscope, it is not easy to polish the hand-held sample on a high-speed polishing machine

The speed of the polishing machine is fast, and it is easy to slip and cause the sample to fly out of the polishing disc

Only long-term experienced polishing personnel can barely hold the polishing, which leads to the difficulty of polishing due to the small sample size in the traditional sample preparation steps.

[0005] The traditional high-temperature laser confocal sample polishing often uses single-finger pressing and polishing. The force on the sample is uneven, and the friction area between the sample and the finger is too small. Pressing and polishing hard will cause polishing scratches on the surface of the sample, which will affect the high-temperature laser. Microscopic observation effect of sample before confocal microscopy experiment

In the subsequent heating process, the unevenness and smoothness of the sample surface will affect the in-situ observation effect of the whole experiment

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