Dark-field microscope in interference-scattering enhancement mode

A technology of dark field microscope and enhanced mode, applied in the field of dark field microscope, can solve the problems of loss of light energy, uneven light wave of illumination beam, poor controllability, etc., to improve uniformity, meet the requirements of observation and imaging, and improve resolution. The effect of rate and application range

Pending Publication Date: 2020-01-17
NANJING MEDICAL UNIV
View PDF1 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to overcome the problems in the dark-field digital holographic microscopy illumination light in the prior art, such as poor controllability of the inner and outer radius of the ring-shaped illumination light, uneven light waves, weak imaging contrast, and a large loss of light energy, and to improve the system Resolution, enhanced contrast of reproduced images, Chinese patent (publication number CN107907983A) discloses a digital holographic microscope device and its working method based on local hollow beam illumination. The Bessel beam is focused by the lens to form a local hollow beam, and then the generated local hollow beam enters the dark field condenser and forms an annular light cone to illuminate the experimental sample to obtain the scattered light of the object, and then the digital holography will disperse the scattered light of the object The light interferes with the spherical wave reference light, and the interfering fringes are recorded into the computer through the photoelectric coupling device. However, the patented technical solution still has the unevenness of the light wave of the illumination beam in the dark field microscope, the large background signal, a large loss of light power, and poor imaging contrast. and other technical problems, and the patented technical solution uses a cone mirror to form a non-diffraction-like Bessel beam and a local hollow beam formed by lens focusing. The resolution cannot be further improved through multiple optical path interferences. After multiple optical path interferences, it will serious image distortion

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Dark-field microscope in interference-scattering enhancement mode
  • Dark-field microscope in interference-scattering enhancement mode
  • Dark-field microscope in interference-scattering enhancement mode

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0026] It should be noted that if there is a directional indication (such as up, down, left, right, front, back...) in the embodiment of the present invention, the directional indication is only used to explain the position in a certain posture (as shown in the accompanying drawing). If the specific posture changes, the directional indication will also change accordingly.

[0027] In addition, if there are descriptions involving "first", "second" and ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a dark-field microscope in an interference-scattering enhancement mode. The dark-field microscope comprises a light source for emitting light, a reflection light path composedof a plurality of reflectors, and a detection device arranged above a sample to be tested, the light source emits parallel beams, the parallel beams enter the reflection light path after passing through the sample to be tested, and pass through the sample to be tested again after passing through the reflection light path in the form of parallel beams, and the sample to be tested generates scattering to be detected by the detection device. Compared with the prior art, the technical scheme of the invention has the advantages of simple structure, convenient operation, sensitive detection, high reliability and the like. Compared with the existing dark-field microscope, the dark-field microscope disclosed by the invention has the advantages of significantly improving the resolution and the application range of the microscope, meeting the nanometer-scale observation and imaging requirements, having low construction cost, and being able to be popularized and applied in ordinary laboratories.

Description

technical field [0001] The invention relates to the technical field of dark field microscopes, in particular to a dark field microscope in an interference-scattering enhanced mode. Background technique [0002] In the field of life science technology, in order to study the interaction between nano-drugs and tumor cells and the nano-scale extracellular vesicles secreted by cells, the use of microscopic imaging technology is an essential technical means. The existing technology usually uses molecular fluorescence The representative spectral analysis method has the advantages of real-time, in-situ, and non-invasive, and thus has been widely used in the field of life analysis technology. time, and inevitably interfere with the behavior of the research subjects, and even cause the death of the research subjects. [0003] In order to solve the above-mentioned technical problems in fluorescence analysis, dark-field microscopes emerged as the times require. Dark-field microscopes h...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N21/84G01N21/45G01N21/01
CPCG01N21/01G01N21/45G01N21/84G01N2021/0112
Inventor 方一民黄宗雄陈珊孙俊杰
Owner NANJING MEDICAL UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products