Mpedance matching device provided in high frequency power system
A technology of impedance matching and high-frequency power supply, which is applied in the direction of impedance matching network, impedance network, circuit, etc., can solve the problems of plasma instability, inability to improve impedance mismatch, fire, etc., and achieve the effect of improving impedance mismatch
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no. 1 example
[0031] figure 1 A high-frequency power supply system 10 including the impedance matching device 12 according to the first embodiment of the present invention is shown. The high-frequency power supply system 10 is used to supply the required power to the load 20, such as figure 1 As shown, a high frequency power supply 11 and a matching unit 16 are also included.
[0032] The high-frequency power supply 11 outputs high-frequency power to the load 20 via the matching unit 16 . The high-frequency power supply 11 is configured to be able to adjust the oscillation frequency (that is, the high-frequency power frequency).
[0033] Such as figure 2 As shown in (A), the matching unit 16 includes two capacitors and one inductor whose constant (capacitance) can be changed. The constant of the capacitor is changed by a matching state detection unit and a control unit (not shown) included in the matching unit 16 so as to improve the impedance mismatch between the high-frequency pow...
no. 2 example
[0051] The impedance matching device 12 according to the second embodiment of the present invention includes a matching state value acquisition unit 13 , a control unit 14 , and a setting storage unit 15 similarly to the first embodiment. However, the control unit 14 in this embodiment operates differently from the control unit in the first embodiment. Below, refer to Figure 9 as well as Figure 10 , an example of the operation of the control unit 14 of the second embodiment will be described.
[0052] First, the control unit 14 reads the setting information stored in the setting storage unit 15 (step S2-1). The setting information includes a first slope, a second slope, a mismatch suppression period, and a threshold.
[0053] Next, the control unit 14 judges whether or not the matching state has deteriorated rapidly in the same manner as step S1-2 of the first embodiment (step S2-2). The control unit 14 repeatedly executes step S2-2 every 100 μs until the matching state ...
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