A system and method for measuring the refractive index of materials in the terahertz band
A technology of terahertz and refractive index, applied in the field of terahertz detection at room temperature, can solve the problems of small incident wavelength, long debugging time, complex optical path, etc., and achieve the effect of improving accuracy and good technology portability
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[0070] In order to verify the effectiveness of the scheme of the present invention, standard A4 sheets of paper, plastic films, and glass sheets of different thicknesses were selected for simulation experiments. When scanning the terahertz path, control the motorized stage to move the detector, and scan the first half of the distance of the optical path, such as figure 1 The distance represented by L1 on the right side of the material shown, and then the dielectric material is fixed in the middle of the scanning optical path, and the electric stage is controlled to move the detector backwards (away from the terahertz source), and the moving distance is L2 ,Such as figure 1 shown. In this embodiment, the number of moving steps is set to 200, and the step length is set to 25 μm. Insert the material at the position of step 100 (the middle position between L1 and L2), figure 2 Shown is the detected response voltage as the probe moves.
[0071] Then perform segment filtering o...
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