Process for preventing anodic oxidation deformation of bolt bottom plate of DaVinci test socket

A technology of anodizing and testing sockets, used in test/measurement connectors, contact manufacturing, electrolytic coatings, etc., can solve problems affecting assembly accuracy and function, test pin damage, etc., to ensure stability, easy operation, simple craftsmanship

Pending Publication Date: 2020-06-12
江苏先锋精密科技股份有限公司
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

But at the same time, limited by the size of the chip, the pin top plate is usually designed to have a thickness of about 4mm, a length and width of about 60mm, and a structure densely covered with small holes. During the process, there will be obvious deformation, and the position and shape of the small hole will change, which will affect the assembly accuracy and function, and even cause damage to the test pins

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  • Process for preventing anodic oxidation deformation of bolt bottom plate of DaVinci test socket
  • Process for preventing anodic oxidation deformation of bolt bottom plate of DaVinci test socket

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Embodiment Construction

[0012] In order to make the purpose of the invention, technical solutions and beneficial technical effects of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific implementation methods;

[0013] In the accompanying drawings: the anti-anodizing deformation process of the pin bottom plate of Da Vinci test socket, which is characterized in that it includes the following operation steps: Step 1, reserve a margin on the pin bottom plate before anodizing for the first time: the length and width of the cutting material are in Add 30-40mm to the maximum shape of the pin bottom plate, and increase the thickness by 1-2mm; Step 2, anodize the pin bottom plate: connect the pin bottom plate to the positive electrode, and the liquid in the oxidation tank to the negative electrode, and power on for 90-120 minutes to make it A layer of aluminum oxide film with a thickness of 40μm-60μm is forme...

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Abstract

The invention discloses a process for preventing anodic oxidation deformation of a bolt bottom plate of a DaVinci test socket. The process is characterized by comprising the following operation steps:step 1, reserving allowance on the bolt bottom plate before first anodic oxidation; step 2, carrying out anodic oxidation treatment on the surface of the bolt bottom plate; step 3, cutting off the allowance reserved on the bolt bottom plate, and processing the outline of the product; meanwhile, machining holes needing to be conducted; step 4, protecting all areas except the outer contour edge ofthe product by using a high-temperature-resistant and acid-corrosion-resistant adhesive tape; step 5, carrying out secondary anodic oxidation treatment; the processis simple in process and convenientto operate; the influence of heat generated by anodic oxidation treatment on the positions of the pin mounting holes is effectively reduced, the change of the shapes and the positions of the small holes can be effectively reduced or avoided, the quality stability in the product technological process is ensured, and mass production becomes possible.

Description

technical field [0001] The invention relates to the field of da Vinci test sockets, in particular to a technique for preventing anodic oxidation deformation of a pin bottom plate of a da Vinci test socket. Background technique [0002] In the field of IC testing, the traditional use of composite plastics to make spring probe sockets provides limited bandwidth capabilities during testing, and the manufacturing process and difficulty are very complicated. Da Vinci test socket changes the traditional process, uses aluminum alloy as the base of the product, and then through partial or overall anodic oxidation treatment, uses the good conductivity of aluminum alloy itself and the insulation of aluminum oxide to meet the requirements of the test process for equipment functions. It avoids the loss of test frequency caused by inserting conductive leads on the plastic substrate in the past, and realizes a more accurate test of chip operating frequency. But at the same time, limited ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01R43/00H01R43/16C25D11/12
CPCC25D11/12H01R43/00H01R43/16H01R2201/20
Inventor 游利管明月
Owner 江苏先锋精密科技股份有限公司
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