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Magnetic field detector based on surface enhanced Raman scattering

A surface-enhanced Raman and detector technology, applied in the field of magnetic field detection, can solve the problems of high detection limit and low sensitivity, and achieve the effect of low detection limit and high sensitivity

Inactive Publication Date: 2020-08-25
中山科立特光电科技有限公司
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  • Abstract
  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

Traditional magnetic field detectors have low sensitivity and high detection limit

Method used

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  • Magnetic field detector based on surface enhanced Raman scattering
  • Magnetic field detector based on surface enhanced Raman scattering
  • Magnetic field detector based on surface enhanced Raman scattering

Examples

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Effect test

Embodiment 1

[0019] The invention provides a magnetic field detector based on surface-enhanced Raman scattering. The magnetic field detector includes a light source, a photodetector, a substrate 1 , a deformation layer 2 and a noble metal layer 3 . Such as figure 1 As shown, the deformation layer 2 is placed on the substrate 1 , and the noble metal layer 3 is placed on the deformation layer 2 . The deformation layer 2 includes a first magnetostrictive material, and the noble metal layer 3 includes noble metal particles, and the material of the noble metal particles is gold.

[0020] When measuring the magnetic field, chemical molecules, such as rhodamine 6G molecules, are arranged on the noble metal layer 3 . The noble metal layer 3 is irradiated with a light source. The light source is a monochromatic light source, such as a light source with a wavelength of 532 nanometers. The light source excites the chemical molecules to produce surface-enhanced Raman scattering, and the light detec...

Embodiment 2

[0025] On the basis of Example 1, the magnetostriction coefficient of the first magnetostrictive material is a positive value. The noble metal nanoparticles contain an inner core, and the inner core is a second magnetostrictive material. The magnetostriction coefficient of the second magnetostrictive material is negative. The magnetostriction coefficient of the first magnetostrictive material is positive, such as iron; the magnetostriction coefficient of the second resignation stretchable material is negative, such as nickel. Under the action of the magnetic field to be measured, the first magnetostrictive material expands to increase the distance between the noble metal particles; the second magnetostrictive material contracts to increase the distance between the noble metal particles due to the reduction in the size of the noble metal particles. The effects of these two aspects will increase the distance between the noble metal particles and change the electric field betwee...

Embodiment 3

[0027] On the basis of Example 2, the heights of the noble metal nanostructure trimer 5 are different. That is, the height of the trimer as a unit is not the same. For adjacent nanostructures with different heights, under the action of excitation light, in addition to the electric field coupling between the nanostructures in the horizontal direction, the electric field coupling along the height direction will also occur. When the distance between nanostructures is changed, the electric field coupling in the horizontal direction and the electric field coupling in the height direction are changed at the same time, the electric field near the nanostructures is changed more, the signal intensity of surface-enhanced Raman scattering is changed more, and the magnetic field is increased. Sensitivity of detection.

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Abstract

The invention provides a magnetic field detector based on surface enhanced Raman scattering. Noble metal particles are arranged on the first magnetostriction material; under the action of the magneticfield to be measured, the first magnetostrictive material deforms, the distance between the noble metal particles is changed, and therefore the electric field intensity near the noble metal particlesis changed, the surface enhanced Raman scattering signal intensity of chemical molecules is changed, and the magnetic field to be measured is determined according to the surface enhanced Raman scattering signal intensity. The intensity of the surface enhanced Raman scattering signal is in direct proportion to the quarters of the local electric field; the surface enhanced Raman scattering is verysensitive to the electric field near the metal nanostructures, and the electric field near the nanostructures is very sensitive to the distance between the nanostructures, so that the detector has theadvantages of high sensitivity and low detection limit, and has a good prospect in the field of magnetic field detection.

Description

technical field [0001] The invention relates to the field of magnetic field detection, in particular to a magnetic field detector based on surface-enhanced Raman scattering. Background technique [0002] Magnetic field detection involves various fields of production and life, and improving the sensitivity and detection limit of magnetic field detectors is the current frontier. Traditional magnetic field detectors have low sensitivity and high detection limit. Contents of the invention [0003] To solve the above problems, the present invention provides a magnetic field detector based on surface-enhanced Raman scattering, which includes a light source, a light detector, a substrate, a deformation layer, and a noble metal layer. The deformation layer is placed on the substrate, and the noble metal layer is placed on the deformation layer. The deformable layer includes a first magnetostrictive material. The noble metal layer includes noble metal particles. When measuring ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/032
CPCG01R33/0327
Inventor 不公告发明人
Owner 中山科立特光电科技有限公司
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