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Method and device for measuring exciton orientation of luminescent material

A technology of luminescent materials and measurement methods, which is applied in the direction of material excitation analysis, polarization influence characteristics, etc., can solve the problems of inapplicable doping material system and inaccurate results, and achieves simplified optical path system, fast calculation speed, and simple method. Effect

Active Publication Date: 2021-11-19
武汉宇微光学软件有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This method does not require a model, it is very simple but requires the luminescent material to be isotropic before thermal annealing and the results are not very accurate
At present, ellipsometer is commonly used to measure the optical constants of materials to determine the molecular orientation of luminescent materials. It is to measure the polarization and phase changes of linearly polarized light (S light and P light) reflected by the sample multiple times, but this measurement method is not applicable. in doped material system

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  • Method and device for measuring exciton orientation of luminescent material
  • Method and device for measuring exciton orientation of luminescent material
  • Method and device for measuring exciton orientation of luminescent material

Examples

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Embodiment 1

[0091] The present example concerns the exciton orientation of the pure phosphor RD. Sample A is a luminescent film made of material RD by vacuum evaporation, and its substrate is quartz glass; the theoretical thickness of material RD is 50nm, and the shape of sample A is a square with a size of about 20mm×20mm. Specifically include the following steps:

[0092] (1) Coat the luminescent layer material whose base is glass with refractive index matching oil, and fix it on the sample stage of the angle-resolved photoluminescence instrument. Turn on the LED light source (375nm), rotate the turntable 80°, measure the angle-resolved spectral data with a spectrometer through a semi-cylindrical fused silica lens every 1° Use a spectrometer to record spectral data, such as Figure 4 shown.

[0093] (2) At this time, the spectral data obtained at this time is the spectral range of each angle from 0 to 80° and the wavelength from 400nm to 800nm. According to the PL spectrum of the lumi...

Embodiment 2

[0098] This embodiment relates to the molecular orientation of the doped luminescent material RHRD. RHRD is that RD is the luminescent material and RH is the main material. The RD doping ratio is 3% as the luminescent film, the substrate is glass, and it is made by vacuum evaporation. Its area size is about 20mm×20mm. Specifically include the following steps:

[0099] (1) Coat the luminescent layer material whose base is glass with refractive index matching oil, and fix it on the sample stage of the angle-resolved photoluminescence instrument. Turn on the LED light source (375nm), debug and fix it at the 0° position of the rotary table, rotate the rotary table 80°, and use a spectrometer to measure the angle-resolved spectral data through a semi-cylindrical fused silica lens every 1° Use a spectrometer to record spectral data, such as Figure 8 shown.

[0100] (2) At this time, the spectral data obtained at this time is the spectral range of each angle from 0 to 80° and the ...

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Abstract

The invention belongs to the technical field of photoelectric measurement, and discloses a method and device for measuring the exciton orientation of a luminescent material. The method includes the following steps: (1) constructing a forward luminescence calculation model for distinguishing photoluminescence spectra of luminescent materials, The forward luminescence calculation model first equates the quantum mechanical description of the exciton transition to the classical electromagnetic theory description of the electric dipole radiation in the microcavity structure, and then based on the electric dipole exciton radiation model and the microcavity coherence model, and adopts In the form of a transmission matrix, Fresnel coefficients are used to transmit and reflect on all involved interfaces to solve the electromagnetic field, and then obtain the angle-resolved emission spectrum of the luminescent material; Resolved spectra, based on the measured angle-resolved spectra, combined with the forward luminescence calculation model for reverse inversion to obtain the molecular orientation of the material. The invention can accurately measure and characterize the molecular orientation of the doping material system.

Description

technical field [0001] The invention belongs to the technical field of photoelectric measurement, and more specifically relates to a method and device for measuring the exciton orientation of a luminescent material. Background technique [0002] The exciton orientation of the luminescent material determines the physical and optical properties of the film, such as charge mobility, birefringence, ionization potential, etc. Therefore, the photoelectric properties of light-emitting devices are closely related to the exciton orientation of the film layer, such as device lifetime, efficiency, ionization potential and carrier mobility. Therefore, understanding and controlling the exciton orientation of light-emitting materials has always been a very important topic in the research of light-emitting devices. In terms of optics, one of the methods to improve the light coupling efficiency of light-emitting devices is to make the exciton orientation tend to be horizontal. When the ex...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/63G01N21/21
CPCG01N21/21G01N21/63
Inventor 谷洪刚刘世元王勐田姣姣柯贤华江浩
Owner 武汉宇微光学软件有限公司
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