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J750-based test device and method for high-voltage high-precision analog-to-digital converter

A technology of analog-to-digital converter and test device, which is applied in the directions of analog/digital conversion calibration/test, analog/digital conversion, code conversion, etc., which can solve the problems of increased test time, inaccurate test results, low efficiency, etc., to avoid Use of instruments and equipment, high-efficiency testing, and the effect of reducing costs

Pending Publication Date: 2021-02-02
CHENGDU SINO MICROELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method has a complex structure and high cost, and repeated communication with peripherals also increases the test time and improves the test cost
[0006] The present invention is based on the existing ATE (J750), realizes the test of all parameters of the ADC to be tested by using peripheral components, and solves the shortcomings of the inaccurate test results of the traditional testing machine (ATE) adding operational amplifiers; and the structure of the external equipment is complex, Disadvantages of high cost and low efficiency

Method used

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  • J750-based test device and method for high-voltage high-precision analog-to-digital converter
  • J750-based test device and method for high-voltage high-precision analog-to-digital converter
  • J750-based test device and method for high-voltage high-precision analog-to-digital converter

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] Example 1, such as figure 1 As shown, the present invention provides a kind of testing device of high-voltage high-precision analog-to-digital converter based on J750, it is characterized in that comprising, test board, J750 and high-voltage high-precision DAC, described high-voltage high-precision DAC is positioned at test board, described The high-voltage high-precision DAC is connected to the high-voltage high-precision analog-to-digital converter on the test board, the DISO_SOURCE of the J750 is used as the digital source of the DAC, and the high-precision measurement unit DC_METER of the J750 converts the DAC and the high-voltage high-precision analog-to-digital converter to be tested After the reference voltage of the converter is calibrated, the DAC is controlled to output an analog signal, and the conversion data of the high-voltage high-precision analog-to-digital converter to be tested is collected by DSIO_CAPTURE of the J750.

[0033] The linearity of the hig...

Embodiment 2

[0034] Embodiment 2, when carrying out the non-linear error test of the high-voltage high-precision analog-to-digital converter, a high-precision reference chip and an ultra-low-noise operational amplifier are used on the test board to make the positive and negative reference signals of the high-voltage high-precision DAC slightly larger than the high-voltage to be tested The input range of the high-precision analog-to-digital converter, using J750 to control the high-voltage high-precision DAC to output RAMP waves, such as figure 2 As shown, the obtained RAMP amplitude slightly exceeds the input range of the high-voltage high-precision analog-to-digital converter to be tested. The J750 is used to collect the converted data of the high-voltage high-precision analog-to-digital converter to be tested, and the code density method is used to obtain the high-voltage high-precision high-precision analog-to-digital converter to be tested. The non-linear error of the full code segment...

Embodiment 3

[0035] In embodiment 3, an ultra-high matching resistor network is used to divide the reference voltage of the high-voltage high-precision DAC, and the DC_METER of the J750 is used to measure the voltage values ​​of the high-voltage high-precision DAC and the ADC to be tested to realize the offset error of the ADC to be tested. Use J750 to send the intermediate code value, and collect data from the ADC to be tested to obtain zero-level error; use J750 to send RAMP waves slightly exceeding the positive full-scale and negative full-scale to the high-voltage high-precision DAC, and collect the ADC to be tested through the DC_METER of J750 The converted data, calculate the positive and negative full-scale errors:

[0036]

[0037]

[0038] Among them: error NE_FULL_SACLE is the negative full-scale error,

[0039] error PO_FULL_SACLE is the positive full-scale error,

[0040] Zero error is the zero-level error; DA REFN It is the negative reference voltage of high precisi...

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Abstract

The invention belongs to the field of analog integrated circuit testing, and particularly relates to a J750-based high-voltage high-precision analog-to-digital converter testing device and method. A high-voltage high-precision DAC is arranged on a test board, the high-voltage high-precision DAC is connected with a to-be-tested high-voltage high-precision analog-digital converter located on the test board, DISO_SOURCE of J750 serves as a digital source of the DAC, a high-precision measurement unit DC_METER of J750 calibrates reference voltage of the DAC and the to-be-tested high-voltage high-precision analog-digital converter, and then controls the DAC to output an analog signal; and the conversion data of the high-voltage high-precision analog-to-digital converter to be tested is acquiredby the DSIO_CAPTURE of J750. The low-cost, high-efficiency and high-precision test of the high-voltage and high-precision analog-to-digital converter is realized.

Description

technical field [0001] The invention belongs to the field of analog integrated circuit testing, and in particular relates to a testing device and method for a J750-based high-voltage high-precision analog-to-digital converter. Background technique [0002] Analog-to-digital converter (ADC) is an important part of integrated circuits, and its performance has reached a new height with the rapid development of the semiconductor industry. From the current point of view, the analog-to-digital converter (ADC) is mainly divided into two directions: high-speed and high-precision. High-precision ADC is a sub-branch of high-precision ADC. Although there are relatively few product types, its mass production test has always been an urgent problem to be solved. [0003] The mass production test of integrated circuits is often completed relying on the integrated circuit test system (ATE), and there is no exception for high-voltage and high-precision ADCs. However, the commonly used ATE ...

Claims

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Application Information

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IPC IPC(8): H03M1/10
CPCH03M1/1071
Inventor 张超刘建明杨超谌谦杜超宋宇吴羿李小虎
Owner CHENGDU SINO MICROELECTRONICS TECH CO LTD
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