An intelligent test device for high-temperature superconducting terahertz radiation sources based on different bias conditions
A terahertz radiation source and high-temperature superconducting technology, which is applied in the field of high-temperature superconducting terahertz radiation source intelligent testing devices and testing devices, can solve the problem of inability to accurately adjust the cooling temperature, unbalanced cooling on the surface of the radiation source, affecting the terahertz wave power and other problems to achieve the effect of shortening preparation time, improving creativity and practicability, and saving helium resources
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Embodiment 1
[0032] like Figure 1-8 As shown, an intelligent test device for high-temperature superconducting terahertz radiation sources based on different bias conditions, including a test bench (1), the upper surface of the test bench (1) is fixedly installed with a low-temperature refrigeration system, an optical transmission system and signal acquisition With the storage system, a sealed casing (2) is fixedly installed on the left side of the upper surface of the test bench (1), and the low-temperature refrigeration system is located under the sealed casing (2). The low-temperature refrigeration system includes a Stirling refrigerator (3), A cooling cavity (7) is installed at the output end of the Stirling refrigerator (3), a liquid nitrogen cooling tank (19) is installed on the right side of the cooling cavity (7), and a support is fixedly installed at the bottom of the liquid nitrogen cooling tank (19) frame (8), and the support frame (8) is fixedly installed on the upper surface o...
Embodiment 2
[0042] like Figure 1-8 As shown, an intelligent test device for high-temperature superconducting terahertz radiation sources based on different bias conditions, including a test bench (1), the upper surface of the test bench (1) is fixedly installed with a low-temperature refrigeration system, an optical transmission system and signal acquisition With the storage system, a sealed casing (2) is fixedly installed on the left side of the upper surface of the test bench (1), and the low-temperature refrigeration system is located under the sealed casing (2). The low-temperature refrigeration system includes a Stirling refrigerator (3), A cooling cavity (7) is installed at the output end of the Stirling refrigerator (3), a liquid nitrogen cooling tank (19) is installed on the right side of the cooling cavity (7), and a support is fixedly installed at the bottom of the liquid nitrogen cooling tank (19) frame (8), and the support frame (8) is fixedly installed on the upper surface o...
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