Unlock instant, AI-driven research and patent intelligence for your innovation.

A kind of manufacturing method of high-speed dfb laser

A DFB laser and manufacturing method technology, applied in the field of optoelectronics, can solve the problems of poor chip heat dissipation, increased chip reliability risk, complex manufacturing process, etc., and achieve the effects of long-term reliability improvement, long-term reliability improvement, and process difficulty reduction.

Active Publication Date: 2022-07-08
湖北光安伦芯片有限公司
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

(1) Using the BH scheme, it is necessary to increase semi-insulating (Fe or Ru) buried growth, and the manufacturing process is complicated. At the same time, semi-insulating growth is easy to introduce growth defects, thereby affecting reliability; (2) Using the RWG scheme, the manufacturing process is simple, but the chip Small size increases the difficulty of chip cleavage and clamping. At the same time, the Al-containing material on the cavity surface is easily oxidized in the air after cleavage. It is necessary to add a complex coating process to ensure its reliability, but it still cannot completely eliminate the cleavage and coating. resulting in uncertainty
In addition, the size of the chip is reduced, the heat dissipation of the chip is poor, the difficulty of chip packaging and the cost of packaging increase, resulting in an increase in the risk of chip reliability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A kind of manufacturing method of high-speed dfb laser
  • A kind of manufacturing method of high-speed dfb laser
  • A kind of manufacturing method of high-speed dfb laser

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039]The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0040] like Figure 1-Figure 9 As shown, this embodiment provides a method for fabricating a high-speed DFB laser, including the following steps:

[0041] 1) One epitaxial growth is performed on the N-type InP substrate 1, and the first N-type InP layer 2, the N-type grating layer 3, the first intrinsic InP layer 4, the intrinsic InGaAsP layer 5, and the second intrinsic InP layer are grown in turn. The InP layer 6 forms an epitaxia...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The present invention provides a method for manufacturing a high-speed DFB laser, comprising the following steps: 1) growing a first N-type InP layer, an N-type grating layer, a first intrinsic InP layer, and an intrinsic InGaAsP layer on an N-type InP substrate in sequence 2) The optical waveguide region and the non-optical waveguide region are formed by photolithography, and the first intrinsic InP layer, the intrinsic InGaAsP layer and the second intrinsic InP layer in the non-optical waveguide region are etched away; 3 ) Make gratings in the non-optical waveguide region; 4) Perform low temperature heat treatment on the epitaxial wafer first, and then perform high temperature heat treatment; then grow the second N-type InP layer, AlGaInAs multiple quantum wells, the first P-type InP layer, P-type InGaAsP stop layer, the second P-type InP layer, and the P-type InGaAs contact layer; 5) lithography to form a ridge waveguide; 6) to perform lithography on the ridge bar injection area; 7) to form BCB regions on both sides of the ridge bar; 8) Photolithography to form P-surface electrode; 9) N-surface electrode fabrication. In the present invention, the chip size is equivalent to that of 2.5G DFB products, the oxidation of Al-containing materials can be eliminated, and the reliability of high-speed DFBs can be significantly improved.

Description

technical field [0001] The invention belongs to the technical field of optoelectronics, and in particular relates to a manufacturing method of a high-speed DFB laser. Background technique [0002] With the continuous development of the Internet information age, the rapid advancement of data centers and 5G networks, and the continuous increase in the amount of data information transmission, the transmission rate of DFB lasers as an information transmission medium has been continuously improved. In particular, 25G DFB lasers have become the mainstream solution for applications. Therefore, the reliability of high-speed DFB lasers will be an important guarantee for high-speed transmission. [0003] At present, 25G DFB lasers mainly use RWG and BH schemes of AlGaInAs material system with short cavity length (generally 150um). (1) Using the BH scheme, it is necessary to increase the semi-insulating (Fe or Ru) buried growth, and the fabrication process is complicated. At the same ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01S5/20H01S5/22H01S5/125
CPCH01S5/2004H01S5/2209H01S5/2207H01S5/12
Inventor 张恩刘建军许海明李紫谦黄鹤
Owner 湖北光安伦芯片有限公司