Acceleration test profile optimization method and system, electromechanical product, medium and terminal

A technology for accelerated testing, electromechanical products, applied in design optimization/simulation, electrical digital data processing, computer-aided design, etc. It can solve problems such as failure to consider the impact of test results, inaccurate life evaluation, and inability to guide stress transition time.

Pending Publication Date: 2021-03-05
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] (3) Existing accelerated life tests of electromechanical products cannot guide the stress transition time during the test, and do not consider the influence of the stress transition time on the test results
[0011] The difficulty in solving the above problems and defects is: electromechanical products, especially aerospace electromechanical products, due to the particularity of their application scenarios, the product itself has the characteristics of high reliability and long life, so the efficiency of accelerated life test is low , only improving the test efficiency will inevitably lead to inaccurate life evaluation

Method used

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  • Acceleration test profile optimization method and system, electromechanical product, medium and terminal
  • Acceleration test profile optimization method and system, electromechanical product, medium and terminal
  • Acceleration test profile optimization method and system, electromechanical product, medium and terminal

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Embodiment

[0128] Such as figure 2 As shown, the present invention is specifically realized through the following process:

[0129] 1) Construct the cumulative failure model according to the failure distribution and acceleration model of electromechanical products:

[0130] 1 Determine the accelerated test profile and design variables

[0131] In order to facilitate the analysis, the present invention will optimize the design of the three-step acceleration test section. Such as image 3 Shown, S m In order not to change the maximum accelerated stress of the failure mechanism, it can be determined according to a small amount of preliminary tests or simulations; t c It is the cut-off time of the test, which can be determined according to engineering experience or a small amount of preliminary tests; S 1 and S 2 is the accelerated stress level; t 1 and t 2 is the stress conversion time; S 0 The normal working stress level for the product.

[0132] Due to the large number of param...

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Abstract

The invention belongs to the technical field of reliability tests, and discloses an acceleration test profile optimization method and system, an electromechanical product, a medium and a terminal, andthe method comprises the steps of building an accumulated failure model according to the failure distribution of the mechanical and electrical product and an acceleration model; simulating failure data by adopting a Monte Carlo method; estimating model parameters by adopting a maximum likelihood method; and minimizing the progressive variance of the life estimation value of the product under thenormal stress level as an optimization criterion. Based on three-parameter index Weibull distribution, temperature is used as acceleration test stress of the mechanical and electrical product, a stepping form is used as an acceleration test stress loading mode of the mechanical and electrical product, and progressive variance minimization of a life estimation value of the product under a normal stress level is used as an optimization criterion; the problems of long test time and low life estimation precision of mechanical and electrical products in the accelerated life test process are solved.

Description

technical field [0001] The invention belongs to the technical field of reliability test, and in particular relates to an accelerated test profile optimization method, system, electromechanical product, medium and terminal. Background technique [0002] At present, the basic principle of accelerated life testing is based on reasonable engineering experience and statistical assumptions, using higher environmental stress to quickly expose the product to a fault state, and further using the rapidly obtained product fault information for reliability assessment. In the reliability technology, the accelerated life test has the obvious advantage of high test efficiency for high reliability and long life products, which greatly reduces the test time and test cost, and its huge advantages make it widely used in the development of new materials , electromechanical equipment development and aerospace research and other fields. [0003] In order to achieve the goal of accurately evaluat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/20G06F119/02G06F119/04
CPCG06F30/20G06F2119/02G06F2119/04
Inventor 马洪波孔宪光杨飞陈志伟黑惊博
Owner XIDIAN UNIV
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