Acceleration test profile optimization method and system, electromechanical product, medium and terminal
A technology for accelerated testing, electromechanical products, applied in design optimization/simulation, electrical digital data processing, computer-aided design, etc. It can solve problems such as failure to consider the impact of test results, inaccurate life evaluation, and inability to guide stress transition time.
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[0128] Such as figure 2 As shown, the present invention is specifically realized through the following process:
[0129] 1) Construct the cumulative failure model according to the failure distribution and acceleration model of electromechanical products:
[0130] 1 Determine the accelerated test profile and design variables
[0131] In order to facilitate the analysis, the present invention will optimize the design of the three-step acceleration test section. Such as image 3 Shown, S m In order not to change the maximum accelerated stress of the failure mechanism, it can be determined according to a small amount of preliminary tests or simulations; t c It is the cut-off time of the test, which can be determined according to engineering experience or a small amount of preliminary tests; S 1 and S 2 is the accelerated stress level; t 1 and t 2 is the stress conversion time; S 0 The normal working stress level for the product.
[0132] Due to the large number of param...
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