Passivation method of semiconductor device
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- 度亘激光技术(苏州)有限公司
- Publication Date
- 2021-04-30
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Figure 1
Abstract
Description
technical field
[0001] The invention relates to the technical field related to semiconductors, in particular to a passivation method for semiconductor devices. Background technique
[0002] In order to improve the reliability of the cavity surface of the bar, the cavity surface coating process has become one of the key core technologies. Before the cavity surface coating of the cleaved bar, the cavity surface needs to be passivated; After treatment, it will be naturally oxidized, and an oxide layer is easily formed on the cavity surface, and the generated substance with a small band gap is easy to absorb light and generate heat.
[0003] Therefore, it is necessary to clean the chamber surface before passivation. In the usual preparation process, the cleaved strips will be placed on the fixture first, and then transported to the chamber for cleaning after the strips on the fixture are full. When the first cleaved and last cleaved bars are subjected to the same plasma cleanin...