X-ray energy spectrum combined measurement spectrometer and implementation method thereof

Abstract

The invention discloses an X-ray energy spectrum combined measurement spectrometer, which is used for measuring an X-ray energy spectrum in the same direction by combining a crystal diffraction method and a filter disc stacking method, and comprises a radiation shielding module, a crystal diffraction spectrum measurement module and a filter disc stacking spectrum measurement module which are sequentially and coaxially arranged in a shielding shell from front to back, and an aiming assembly for centering. According to the invention, two spectrum measurement methods of crystal diffraction and filter attenuation are combined, the technical problem that high precision and wide range cannot be realized at the same time in the prior art is solved, high-precision wide-range energy spectrum measurement is realized in a single view angle, and the method can be used for diagnosing energy spectrum data of a laser X-ray source, an X-ray tube ray source and the like from keV to MeV. The method has the advantages of large spectrum measurement range, high energy spectrum resolution, fragment strike resistance, plasma splashing resistance, small occupied space and solid angle, wide application range and the like.

Description

technical field [0001] The invention relates to the technical field of X-ray energy spectrum measurement, in particular to an X-ray energy spectrum combined measurement spectrometer and its implementation method. Background technique [0002] Since its discovery, X-rays have been widely used in many fields such as industry, agriculture, and medical treatment, and have played an important role in scientific research and national economy and people's livelihood. At present, the main commonly used X-ray devices include: radioactive sources, X-ray machines, accelerator X-ray sources, and the like. With the continuous advancement of strong laser technology, the use of strong laser drive can generate X-rays in a variety of ways, becoming a new way to generate X-rays. The radioactive source produces X-rays with relatively simple energy spectrum characteristics, and the rest of the methods are based on the interaction between electron beams and matter. The X-ray energy spectrum gen...

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Problems solved by technology

Semiconductor-based detectors are common energy spectrum detectors, but limited by the sampling frequency of electronics, they cannot be used for ultra-high count rate X-ray sources, such as laser X-ray sources, etc.

The crystal spectrometer based on crystal diffraction spectroscopy has high energy spectrum resolution, but limited by the crystal diffraction angle and diffraction efficiency, its spectrum measurement range is relatively narrow, usually from a few keV to hundreds of keV

Spectrum diagnostic techniques based on the filter method include filter stacks, fan-shaped filters, and use filters and time-integrated recording media to measure gamma-ray energy spectra, but the accuracy of the filter method is too low for fine spectral line structures Measurement

At present, the X-ray energy spectrum measurement equipment based on the above-mentioned measurement principle is all discrete equipment. In order to simultaneously measure the characteristic spectral lines of the X-ray source with fine structure and the bremsstrahlung radiation in a wide energy range, it is necessary to install multiple sets of equipment, and the required diagnostic three-dimensional The angle is large, the measurement orientation of each equipment is inconsistent, and it is difficult to obtain the accurate spectrum of the anisotropic X-ray source

For the new X-ray source produced by laser targeting, a large number of high-energy electrons, protons, heavy ions and other rays generated at the same time will seriously interfere with the X-ray energy spectrum measurement, which increases the difficulty of accurately measuring the X-ray energy spectrum

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