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Complex Permittivity Sensor and Measurement System Based on Dielectric Integrated Suspension Wire

A technology of complex permittivity and dielectric integration, applied in the microwave field, can solve the problems of low measurement accuracy and complexity, and achieve the effects of impedance matching, measurement accuracy improvement, and less energy leakage

Active Publication Date: 2022-05-24
SICHUAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] Aiming at the problems of complicated sensor structure and low measurement accuracy existing in the current complex permittivity measurement, the purpose of the present invention is to provide a complex permittivity sensor based on medium-integrated suspension wires, which can reduce the sensor structure while simplifying the sensor structure. The dielectric loss of the sensor improves the measurement accuracy of the complex dielectric constant of the sensor

Method used

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  • Complex Permittivity Sensor and Measurement System Based on Dielectric Integrated Suspension Wire
  • Complex Permittivity Sensor and Measurement System Based on Dielectric Integrated Suspension Wire
  • Complex Permittivity Sensor and Measurement System Based on Dielectric Integrated Suspension Wire

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Embodiment 1

[0061] The complex permittivity sensor based on the medium-integrated suspension line provided in this embodiment, such as figure 1 and figure 2 As shown, it includes: a medium-integrated suspension wire structure, and a sample cell 10 arranged on the medium-integrated suspension wire structure for carrying a sample.

[0062] like figure 1 and figure 2 As shown, the above-mentioned dielectric integrated suspension line structure includes five layers of dielectric substrates (a first dielectric substrate 1 to a fifth dielectric substrate 5) stacked from top to bottom, and the upper and lower surfaces of each dielectric substrate are covered with a copper conductive layer (the first metal layer 101 to the tenth metal layer 502 in sequence). The first metal layer 101 and the second metal layer 102 on the first dielectric substrate 1 are provided with slits 103 at corresponding positions in the middle. The middle portion of the second dielectric substrate 2 and the fourth ...

Embodiment 2

[0112] The complex permittivity sensor based on a straight line based on medium integration provided in this embodiment includes: a medium-integrated suspension wire structure, and a sample cell 10 arranged on the medium-integrated suspension wire structure and used for carrying a sample.

[0113] The dielectric integrated suspension structure provided in this embodiment is basically the same as that provided in Embodiment 1, and the difference lies in the structure of the first dielectric substrate.

[0114] like Figure 9 As shown in the figure, five slits 103 ′ are evenly spaced at the corresponding positions of the first metal layer and the second metal layer on the first dielectric substrate 1 ′, with a width of 0.5 mm and a length of 12.5 mm (resonant cavity). 1 / 4 of the working wavelength). Correspondingly, the sample cell 10 is pasted above the five slit grooves 103 ′ of the first dielectric substrate through epoxy resin, and the bottom opening area thereof can cover ...

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Abstract

The invention discloses a complex dielectric constant sensor, a measurement system and a measurement method based on a medium-integrated suspension line. The complex dielectric constant sensor includes a medium-integrated suspension line structure and a sample pool; the medium-integrated suspension line structure includes a top-down There are five layers of dielectric substrates superimposed on the bottom. There are slots at the corresponding positions of the upper conductive layer and the lower conductive layer of the first dielectric substrate; air cavities are set on the second dielectric substrate and the fourth dielectric substrate; the design of the conductive layer on the third dielectric substrate There is a three-level gradual transition feed structure of microstrip line-strip line-suspension line connected as one; the conductive layer under the third dielectric substrate is designed with a resonant metal conduction band; the sample pool is set in the middle of the dielectric integrated suspension line structure on the first layer of dielectric substrate. Through the improvement of the structure, the present invention can reduce external interference and transmission loss, greatly improve the measurement accuracy of resonance frequency and quality factor, and further improve the final measurement efficiency and measurement accuracy of complex dielectric constant.

Description

technical field [0001] The invention belongs to the field of microwave technology, and relates to the measurement of dielectric constant, in particular to a complex dielectric constant measurement technology based on a dielectric integrated suspension line structure. Background technique [0002] Dielectric constant is an important electromagnetic parameter of substances. As one of the most basic physical quantities in microwave applications, it characterizes the electrical polarization and loss characteristics of substances in microwave environments. Accurately measuring the complex permittivity of various media is essential for understanding and mastering the basic properties of the media. [0003] At present, the commonly used complex permittivity measurement methods mainly include the transmission line method, the resonator perturbation method, and the free space method. Due to the remarkable characteristics of small size, light weight, low cost, and easy integration, a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/26
CPCG01R27/2617G01R27/2623G01R27/2676
Inventor 刘长军廖崇蔚龙卓马奎朱铧丞杨阳
Owner SICHUAN UNIV
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