Driving test device and method for APD device
A driving test and device technology, which is applied in the field of APD device driving test equipment, can solve the problems of high test cost and complicated test equipment, and achieve the effect of reducing the difficulty of detection and the cost of detection
Active Publication Date: 2021-11-02
WUHAN PRECISE ELECTRONICS TECH
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[0003] In view of this, the present application provides a driving test device and method for APD devices to solve the technical problem that the existing APD device test equipment is complex, resulting in high test costs
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[0055] Preferred embodiments of the application are described in detail below in conjunction with the accompanying drawings, wherein the drawings constitute a part of the application and together with the embodiments of the application are used to explain the principles of the application and are not intended to limit the scope of the application.
[0056] In the description of the present application, "plurality" means two or more, unless otherwise specifically defined.
[0057] Reference herein to an "embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the present application. The occurrences of this phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is understood explicitly and implicitly by those skilled in the art that the ...
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The invention relates to a driving test device and method for an APD device, and the device comprises an input module which is used for receiving a test parameter signal and transmitting the test parameter signal to a control module; a control module which is used for performing digital-to-analog conversion on the test parameter signals and then transmitting the test parameter signals; a light source module which is used for receiving an analog signal of a light source wavelength parameter to output a light source to the to-be-tested APD device; a first driving detection module which is used for receiving an analog signal of the APD test voltage / current so as to output the analog signal to a to-be-tested APD device, and collecting an APD avalanche voltage and an APD dark current so as to transmit the APD avalanche voltage and the APD dark current to the control module; a second driving detection module which is used for receiving the analog signal of the power supply voltage so as to transmit the analog signal to the APD device to be detected, and collecting the TIA voltage / current so as to transmit the TIA voltage / current to the control module; and a control module which is also used for determining the quality of the APD device to be tested according to the collected APD avalanche voltage, APD dark current and TIA voltage / current. According to the invention, the quality of the to-be-detected APD device can be efficiently and rapidly detected, and the detection difficulty is reduced.
Description
technical field [0001] The present application relates to the technical field of optoelectronic device testing, in particular to a driving test device and method for APD devices. Background technique [0002] With the development of the optical communication industry, the demand for optical device testing is also increasing. For the coupling and testing of high-speed APD devices, it is necessary to test the avalanche voltage, dark current, responsivity, and TIA current of the APD detector. At the same time, it is necessary to monitor the output signal amplitude and other indicators during coupling. The traditional test uses Keithley2400 series universal source meter (PMU), programmable regulated power supply, stable modulated light source, oscilloscope and other equipment to build the entire coupling and test. At the same time, a set of test software needs to be developed to coordinate equipment linkage. Faced with the entire huge test system, it will bring problems such a...
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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 马超李金金黄秋元周鹏
Owner WUHAN PRECISE ELECTRONICS TECH