Temperature measuring method for core area of temperature field in preparation process of high-temperature material

Abstract

The invention discloses a temperature measuring method for core area of a temperature field in the preparation process of a high-temperature material and belongs to the technical field of high-temperature materials. According to the method, an inclined charging mode is adopted, a crucible is kept in an inclined state relative to a temperature field through a crystallization block, when the temperature of the core area in the temperature field reaches the melting point temperature, the crystallization block is molten, and the crucible is restored to the normal position installation state. Therefore, according to the method provided by the invention, the moment of the crystal melting point temperature can be accurately captured, and the crucible can be recovered to a non-skew normal position installation state, so that the effects of accurate temperature measurement of a key point and zero influence on a temperature field after temperature measurement are achieved.

Description

technical field [0001] The invention relates to the technical field of high-temperature materials, in particular to a method for measuring temperature in a core region of a temperature field during the preparation of high-temperature materials. Background technique [0002] In the field of high-temperature material manufacturing, such as the production of crystal materials such as YAG, sapphire, and LYSO, the high-temperature core area of ​​the temperature field often reaches or exceeds 2000 degrees Celsius, and it is often necessary to determine the key position of the high-temperature core area inside the temperature field in a certain The temperature situation in the comprehensive environment such as power atmosphere can be used to determine the next production action or parameter adjustment. These measurement points are limited by insulation materials, narrow space, high temperature, and accompanied by specific chemical atmospheres such as oxidation, carbonization, and h...

AI Technical Summary

Problems solved by technology

At present, the measurement of the temperature in the high-temperature core area mainly relies on several technical means such as infrared, thermocouple, temperature measuring block, and thermogravity. However, these technical means have two problems in the above-mentioned use cases: (1) In fact, temperature measurement is difficult to achieve; (2) it will change the structure of the temperature field

For known existing metal materials, the temperature of the measurement point has exceeded the upper limit of the working temperature of most available metals. For example, the melting point of platinum with chemical inertness is only 1773 degrees, and the upper limit of the platinum-rhodium thermocouple is only 1700-1800 degrees Celsius. There is nothing that can be done when the temperature in the core high-temperature area of ​​the temperature field such as YAG, sapphire, and LYSO exceeds 2000 degrees Celsius

However, the existing high-temperature alloy materials represented by tungsten and molybdenum do not have the chemical inertness of metals such as platinum, and cannot work for a long time in complex chemical atmospheres such as oxidation, reduction, and carbonization in the furnace.

[0008] In addition, there are additional problems in the thermogravity method. When most metals are close to the melting point, most of the metal grains will become larger, soften, and the mechanical strength of the tensile pressure will drop sharply, and there is a temperature for this phenomenon. range, rather than a fixed temperature point like the melting point, which leads to inaccurate and unreliable methods that rely on metal melting to achieve the purpose of temperature measurement

[0009] The above temperature measurement methods irreversibly change the structure of the core high-temperature area of ​​the temperature field after temperature measurement, which leads to the fact that the actual temperature field distribution deviates from the original design when there is no temperature measurement device in the production of the temperature field after temperature measurement

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