IP core for replacing logic device to realize JTAG bridge switching function

A technology of logic devices and conversion functions, which is applied in the field of IP cores, can solve the problems of increasing circuit module hardware resource overhead, chip shutdown and embargo, etc., and achieve the effect of reducing hardware resource overhead and improving resource utilization

Active Publication Date: 2021-11-05
10TH RES INST OF CETC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there are two limitations in using the SCANSTA112 chip: 1) The SCANSTA112 chip is an imported chip, and there is a risk of the chip being discontinued and embargoed; 2) Using the SCANSTA112 chip will increase the hardware resource overhead of the circuit module

Method used

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  • IP core for replacing logic device to realize JTAG bridge switching function
  • IP core for replacing logic device to realize JTAG bridge switching function
  • IP core for replacing logic device to realize JTAG bridge switching function

Examples

Experimental program
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Embodiment Construction

[0019] refer to figure 1 . In the preferred embodiment described below, a kind of replacement logic device realizes the IP core of JTAG bridge conversion function, comprises: JBIP software (JTAGBridge IP, referred to for short on the management programmable logic device of the tested module or board card) JBIP), and the JBIP software has three working states of waiting address state, address selection state and docking state, and it is characterized in that: in the waiting address state, the JBIP software follows the state change of the boundary scan signal on the boundary scan test bus, and Addressing instructions are processed, and after the address is matched, it enters the address selection state. In the address selection state, JBIP software responds and processes various test instructions; in the docking state, JBIP docks the LSP state machine on the boundary scan of the boundary scan test state machine Logic reset state Test Logic Reset state, retentive state Run-Test-...

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Abstract

The invention discloses an IP core for replacing a logic device to realize a JTAG bridge switching function, which can reduce the hardware resource overhead and improve the resource utilization rate. According to the technical scheme, firstly, three working states of IP core software and functions achieved in each working state are defined; and then, an internal composition block diagram of the IP core software and the connection relations and function descriptions of components are given. In a waiting address state, the JBIP software changes along with the state of a boundary scan signal on the boundary scan test bus, processes an addressing instruction, enters an address selection state after address matching, and responds to and processes various test instructions in the address selection state. The control of a JTAG bus is converted into the control of a local scanning port LSP in a tested module, a SCANSTA112 chip is replaced to realize a JTAG bridge function, and the hardware resource overhead caused by a special chip is reduced.

Description

technical field [0001] The invention relates to an IP core for replacing a logic device to realize a JTAG bridge switching function, in particular to an IP core for replacing a logic device SCANSTA112 chip to realize a JTAG bridge function. Background technique [0002] Today, microelectronics technology has entered the era of very large scale integration (VLSI). With the miniaturization of chip circuits and the development of surface mount technology (SMT) and circuit board assembly technology, traditional testing technology is facing great challenges. In this case, in order to improve the testability of circuits and systems, the Joint Test Action Group (JTAG) proposed a new circuit board test method - boundary scan test in 1987, and it was accepted by IEEE in 1990. Formed the IEEE1149.1 standard, also known as the JTAG standard [1]. This technology replaces the traditional "physical probe" with a new "virtual probe" to improve the testability of circuits and systems. Du...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/34G06F115/08
CPCG06F30/34G06F2115/08
Inventor 文佳任然潘皓梁天辰
Owner 10TH RES INST OF CETC
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