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Tower amplifier testing circuit, system and method

A technology for testing circuits and towers, which is applied in the field of tower testing and can solve problems such as difficulty in realizing automated testing.

Pending Publication Date: 2022-02-25
ANHUI TATFOOK TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The embodiment of the present application provides a tower test circuit, system and method to solve the problem that the existing tower test scheme usually needs to use multiple different devices to test different indicators, and it is difficult to realize the automatic test.

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  • Tower amplifier testing circuit, system and method
  • Tower amplifier testing circuit, system and method
  • Tower amplifier testing circuit, system and method

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Embodiment Construction

[0040]In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

[0041] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude one or more other Presence or addition of features, wholes, steps, operations, elements, components and / or collections thereof.

[0042] It should ...

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Abstract

The invention is applicable to the technical field of tower amplifier testing, and provides a tower amplifier testing circuit, system and method, and the tower amplifier testing circuit comprises a power module, an overcurrent detection module, n direct current switches, n coupling modules, n + 2 one-out-of-two switches, two one-out-of-n switches, an attenuation module, a modulation and demodulation module, a control module, an interface conversion module and an RS485 module. According to the invention, the control module controls the on-off of the n DC switches, the n coupling modules, the n + 2 one-out-of-two switches and the two one-out-of-n switches to realize the switching of the test circuit, so that the transmission intensity and receiving sensitivity of on-off keying signals of the BTS port of the tower amplifier and the RS485 signal channel of the RET port can be tested only based on one tower amplifier test circuit. The performance of the AISG signal of the tower amplifier is ensured to meet the requirement, meanwhile, the transmitting power and the receiving sensitivity of the modem of the AISG signal are tested according to the AISG protocol requirement, and automatic testing is facilitated.

Description

technical field [0001] The application belongs to the technical field of Tower Mounted Amplifier (TMA) testing, and in particular relates to a tower mounted amplifier testing circuit, system and method. Background technique [0002] When testing the antenna interface standard organization (Antenna Interface Standard Group, AISG) signal of the tower, it is necessary to transmit the On-Off Keying (OOK) signal of the base station (Base Transceiver Station, BTS) port of the tower The strength and receiving sensitivity and the RS485 signal channel of the remote electrical tilt (Remote Electrical Tilt, RET) port are tested to ensure that the performance of the AISG signal of the tower amplifier meets the requirements. At the same time, according to the requirements of the AISG agreement, the modem of the AISG signal should comply with the transmission power of 3dBm±2dBm and the receiving sensitivity of -15dBm±3dBm. [0003] However, the existing tower discharge test scheme usuall...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R1/28H04B17/00
CPCG01R31/00G01R1/28H04B17/00
Inventor 陈毅
Owner ANHUI TATFOOK TECH CO LTD
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