Systems and methods for simultaneous phase contrast imaging and electron energy loss spectroscopy
An imaging system and spectrum technology, applied in the direction of circuits, discharge tubes, electrical components, etc.
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[0024] The following description refers to systems for imaging using charged particles, such as figure 1 A system and method for simultaneously acquiring structural and compositional / bonding information of a sample is the charged particle imaging system shown in . Structural information can be obtained by phase contrast imaging such as differential phase contrast (DPC) scanning transmission electron microscopy (STEM) imaging or integrated differential phase contrast imaging via a first detector positioned downstream of the sample. degree (iDPC) STEM imaging. Composition, bonding or electronic structure information can be obtained by electron energy loss spectroscopy (EELS) via a second detector positioned downstream of the first detector. A spectrometer is positioned between the first detector and the second detector to spatially disperse the charged particles based on particle energy. The first detector is centered on the main axis of the charged particle beam. In response...
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