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Intelligent automatic test system based on low-frequency circuit and test method thereof

An automatic test system and circuit technology, applied in the direction of electronic circuit testing, etc., can solve the problems of inability to perform remote operation and observation, manual clamping safety hazards, detachment, etc., to save energy loss, avoid direct contact, and avoid falling off. Effect

Pending Publication Date: 2022-04-12
杭州仁牧科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] Aiming at the deficiencies of the prior art, the present invention provides an intelligent automatic test system and its test method based on low-frequency circuits, which solves the problem that existing personnel still need manual clamping in the process of testing the circuit and there are certain potential safety hazards At the same time, it is necessary to manually replace the clamping point, and during the clamping process, it is easy to have the problem of detachment, and it is impossible to perform remote operation and observation.

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  • Intelligent automatic test system based on low-frequency circuit and test method thereof
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  • Intelligent automatic test system based on low-frequency circuit and test method thereof

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Embodiment Construction

[0039] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0040] see Figure 1-5 , the present invention provides a technical solution: an intelligent automatic test system based on a low-frequency circuit, comprising a test bench 1, and a control panel 2 is installed on the surface of the test bench 1, a chassis 3 is fixedly connected to the bottom of the test bench 1, and the top of the test bench 1 A test box 5 is fixedly installed at the opposite corner of the test box 5 through a support frame 4. The inside of the...

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Abstract

The invention discloses an intelligent automatic test system based on a low-frequency circuit and a test method thereof, the system comprises a test board, the surface of the test board is provided with a control panel, the bottom of the test board is fixedly connected with a bottom frame, and the diagonal position of the top of the test board is fixedly provided with a test box through a support frame, and the invention relates to the technical field of circuit test. According to the intelligent automatic test system based on the low-frequency circuit and the test method thereof, a circuit clamping mechanism is arranged, a cylinder is utilized to drive a piston rod to move, and the piston rod drives a connecting rod and a moving plate to move, so that a rotating rod between a first rotating block and a second rotating block is driven to rotate; according to the device, the two movable rotating shafts are driven to slide in the movable grooves, so that clamping points for testing can be adjusted, transmission clamping can be synchronously realized, the energy loss is reduced, meanwhile, direct contact of personnel is avoided, and the testing safety is enhanced.

Description

technical field [0001] The invention relates to the technical field of circuit testing, in particular to an intelligent automatic testing system based on low-frequency circuits and a testing method thereof. Background technique [0002] A measurement circuit is a circuit that measures the signal under test. In a multi-wire electrical tester, the circuit that uses a galvanometer to measure the potential difference is called a measuring circuit, and the measured potential difference can be obtained according to the following formula: △V=0.001Kic×R×L, where: Kic is the current constant (μA / cm) of the galvanometer system; R is the total resistance of the measurement circuit; L is the centimeter of light spot deflection. It is not difficult to see from the formula that the measurement circuit is mainly a set of precision resistors in addition to the galvanometer system to adapt to the range of the measured potential difference. [0003] Existing personnel also have the followin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
Inventor 钱飞唐维
Owner 杭州仁牧科技有限公司
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