Large-scale structure space deformation measuring device and method with reference light beam capable of non-linearly passing across obstacles

Abstract

The invention relates to a large-scale structure space deformation measurement device and method with a reference light beam capable of non-linearly passing across obstacles, and the device comprises a space reference emission unit and a space pose measurement unit which are designed in a split type structure, thereby improving the flexibility of the device, and having high expansibility based on a series structure. The space reference emission unit adopts cross curve structured light as a reference light beam and provides a space pose measurement reference, and the space pose measurement unit can measure space deformation relative to the reference light beam; the space reference transmitting unit and the space pose measuring unit are used in cooperation to achieve measurement reference transmission, and can be used for large-scale structure space deformation measurement under the condition that the measurement reference and a measurement end are not intervisible due to obstacle shielding. The positions of the image sensor and the image receiving screen are fixed, so that the problem that the system measurement precision is reduced along with the measurement distance in the traditional space deformation measurement technology based on photogrammetry is avoided.

Description

technical field [0001] The invention belongs to the technical field of spatial deformation measurement based on laser and machine vision, and in particular relates to a large-scale structure spatial deformation measurement device and method in which a reference beam can be transmitted nonlinearly across obstacles. Background technique [0002] The space deformation measurement technology based on laser and machine vision is widely used in large-scale structure space deformation measurement and large-scale structural health monitoring and other occasions. [0003] At present, commonly used space deformation measurement equipment includes laser tracker, total station, monocular or binocular photogrammetry and other measurement equipment. Laser tracker, total station and other equipment are expensive and have low measurement speed; monocular or binocular photogrammetry, the measurement accuracy decreases with the increase of the measurement range, and it is impossible to achiev...

AI Technical Summary

Problems solved by technology

Laser tracker, total station and other equipment are expensive and have low measurement speed; monocular or binocular photogrammetry, the measurement accuracy decreases with the increase of the measurement range, and it is impossible to achieve high-precision measurement of large-scale space; and laser tracker, full The measurement optical path of the station instrument, monocular or binocular photogrammetry is easily affected by obstacles, and it is impossible to achieve cross-obstacle measurement when the measurement reference and the measurement point are not in sight

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