Planar crystal spectrometer capable of calibrating wave length of spectral line directly
A spectral line wavelength, crystal spectrometer technology, applied in the field of X-ray emission spectrum measurement, can solve problems such as affecting the radiation properties of light sources, affecting the accuracy of wavelength measurement, and shifting reference spectral lines.
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[0022] Such as figure 1 In the planar crystal spectrometer of the shown structure, the parallel plate reflector 4 used is a parallel plate of thallium hydrogen phosphophthalate crystal (TAP), and the included angle between the surface of the reflector 4 and the receiving surface of the detector 7 is a=68° . An auxiliary diaphragm 3 is added on the surface of the reflector 4, and the metal wires forming the auxiliary diaphragm 3 are lead wires with a line width of 1.5 mm. The distance 302 between two adjacent parallel lines 301 in the auxiliary diaphragm 3 is Δx=5mm. The distance between the first parallel line 301 in the auxiliary aperture 3 and the surface end of the reflector 4 is a=68mm. The measured emission light source S is hit on the aluminum target with a 5TW / 45fs Ti:Sapphire laser to form a plasma light source. The two characteristic lines of the plasma emission spectrum of the aluminum target are calibrated by using the plane crystal spectrometer of the present i...
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