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Semiconductor device, display device, and light-emitting device, and methods of manufacturing the same

A technology for display devices and semiconductors, applied in semiconductor/solid-state device manufacturing, semiconductor devices, organic semiconductor devices, etc., can solve the problems of poor heat resistance of plastic films and semiconductor devices that have not yet been realized

Inactive Publication Date: 2004-06-16
SEMICON ENERGY LAB CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, due to the poor heat resistance of plastic films, the maximum process temperature has to be limited, and as a result, it is currently impossible to fabricate TFTs on plastic films that are as excellent in electrical characteristics as TFTs fabricated on glass substrates
Therefore, semiconductor devices, display devices, or light emitting devices using TFTs formed on plastic films have not yet been realized.

Method used

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  • Semiconductor device, display device, and light-emitting device, and methods of manufacturing the same
  • Semiconductor device, display device, and light-emitting device, and methods of manufacturing the same
  • Semiconductor device, display device, and light-emitting device, and methods of manufacturing the same

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Embodiment 1

[0134] Various embodiments of the present invention are described below with reference to FIGS. 5A-6D . Here, a method of simultaneously manufacturing an n-channel TFT and a p-channel TFT on the same substrate will be described in detail.

[0135] Although a quartz substrate, a semiconductor substrate, a ceramic substrate, a metal substrate, etc. can be used as the substrate 500. However, a glass substrate (#1737) was used as the substrate 500 here. First, a silicon oxynitride layer with a thickness of 100 nm was formed as the nitride layer 501 on the substrate 500 by the PCVD method.

[0136] Subsequently, a 50 nm thick tungsten layer was formed as a metal layer 502 by sputtering, and a 200 nm thick silicon oxide layer was continuously formed as an oxide layer 503 by sputtering without exposure to the atmosphere. This oxide layer was formed under the following conditions: a sputtering device of RF mode was used; a silicon oxide target (30.5 cm in diameter) was used to flow ...

Embodiment 2

[0180] In this embodiment, the case of fabricating a CPU as a semiconductor device of the present invention will be described with reference to FIG. 7 .

[0181] As shown in FIG. 7A, a CPU 705 composed of a combination of a plurality of TFTs is formed on a film 701 containing a fluororesin. A fluororesin-containing film 702 is further formed on the CPU 705 , and the fluororesin-containing films 701 and 702 in this embodiment have a structure that completely covers the CPU 705 . With such a structure, the CPU 705 can be completely blocked from the outside, thereby preventing moisture, oxygen, and the like from entering from the outside.

[0182] However, since the CPU 705 needs to be connected to the outside through the bonding wire 704, the CPU 705 must have a structure in which wiring is formed inside for electrical connection.

[0183] Therefore, in this embodiment, the wiring 706 inside the CPU 705 is connected to the bonding wire 704 via the external connection portion 71...

Embodiment 3

[0188] A semiconductor device formed according to the present invention has a thin-film, lightweight and flexible structure. Therefore, a plurality of semiconductor devices can be combined on one substrate. Note that in addition to glass and quartz, the substrate here also includes flexible substrates such as plastic films.

[0189] In other words, in the case where the semiconductor device is a CPU, a plurality of CPUs can be combined on one substrate to achieve integration.

[0190] In addition, in the case where a plurality of semiconductor devices can be integrated on one substrate, the semiconductor device of the present invention has a film containing a fluororesin formed on its surface, and its surface is reversely sputtered to make its surface The concave and convex shapes are formed, and then, the semiconductor device is attached to the substrate with an adhesive or the like.

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Abstract

A semiconductor device that has the structure that is capable of preventing moisture, oxygen, or the like, from outside from penetrating, in addition to the structure that is being thin, lightweight, flexible and having a curbed surface. In the present invention, the structure that is thin, lightweight, flexible, and that has a curved surface, moreover, that is capable of preventing moisture, oxygen, or the like, from outside from penetrating is realized by means that a structure is formed in which a device formation layer is covered by a fluoroplastic film and by means that TFTs included in a device formation layer is formed of an island-like semiconductor film.

Description

technical field [0001] The present invention relates to a semiconductor device composed of a thin film transistor (hereinafter referred to as TFT) made covered with an organic thin film, a display device, a light emitting device and a method of manufacturing the same. In this specification, the term semiconductor device includes CPU (central processing unit), MPU (micro processing unit), memory, icon, image processor, and the term display device includes liquid crystal display device, PDP (plasma display panel), FED ( field emission display), etc. Background technique [0002] In recent years, a technique of constituting a TFT with a semiconductor thin film (about several nm to several hundred nm in thickness) formed on a substrate having an insulating surface has attracted attention. TFTs are widely used in electronic devices such as ICs (Integrated Circuits) and electro-optical devices. [0003] As substrates on which TFTs are formed, currently, although glass substrates...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/786G02F1/1362H01L21/312H01L21/77H01L21/84H01L27/12H01L27/32H01L51/52H01L51/56H05B33/04
CPCH01L27/3244H01L51/5253H01L51/003H01L27/1266H01L2251/5338H05B33/04H01L51/56G02F1/1362H01L27/14683H01L27/12H01L2227/326H01L27/1214H01L21/3127H01L21/022H01L21/0212H10K71/80H10K59/1201H10K2102/311H10K59/873H10K59/131H01L21/02107H01L21/02172H10K71/00H10K50/844H10K59/12H10K59/1213
Inventor 三崎舜平高山彻鹤目卓也后藤裕吾
Owner SEMICON ENERGY LAB CO LTD