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Multi-wavelength light source generator and the optical amplifier testing method therewith

A multi-wavelength light source and generating device technology, applied in wavelength division multiplexing systems, electromagnetic wave transmission systems, electrical components, etc., can solve the problems of complex devices, unsuitable for large-scale engineering testing, etc., and achieve simple devices and significant application effects. , the effect of saving high costs

Inactive Publication Date: 2004-09-08
ZTE CORP
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Problems solved by technology

In addition, the device is relatively complicated and not suitable for engineering mass testing

Method used

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  • Multi-wavelength light source generator and the optical amplifier testing method therewith
  • Multi-wavelength light source generator and the optical amplifier testing method therewith
  • Multi-wavelength light source generator and the optical amplifier testing method therewith

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Embodiment Construction

[0020] The present invention will be further described below in conjunction with accompanying drawing.

[0021] The generation device of multi-wavelength light source includes:

[0022] Noise source part: The noise source part is composed of a broadband noise spectrum, which can be the noise source emitted by the network analyzer or spectrum analyzer, or the broadband noise source emitted by the adjustable light source. What must be guaranteed here is that the noise spectrum curve must be within Keep the waveform as flat as possible within the required working wavelength range. If the emitted light is not very flat, you can properly add an amplifier with a certain gain slope to slightly adjust the noise spectrum. The output of the noise source part is connected with the input part of the comb filter of the demultiplexing part.

[0023] Demultiplexing part: The principle of the demultiplexing part is usually divided into two types, one is to use the principle of dielectric fil...

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Abstract

The present invention aims at providing one simple and cheap test device and method for measuring the gain flatness and noise index of light amplifier in the evaluation and measurement of light devices for wavelength division multiplexing system. The noise source part is connected to the wavelength dividing part, and the wavelength dividing channels of the wavelength dividing part are connected to the channels in wavelength synthesizing part. The wavelength synthesizing part is connected to the signal light amplifier part, which consists of fiber amplifier and adjustable attenuator. The wavelength dividing part consists of channel interleaver and wavelength dividing device. The said test device is connected to the light amplifier to be tested and spectral analyzer successively for measuring gain flatness and noise index of light amplifier of the light amplifier.

Description

technical field [0001] The invention relates to a device for generating a multi-wavelength light source and its application in testing the gain flatness and noise figure of an optical amplifier. Background technique [0002] In dense wavelength division multiplexing systems, especially in long-distance transmission systems, the gain flatness and noise figure of optical amplifiers are crucial indicators for the transmission performance of the system, so it is necessary to optimize the gain of optical amplifiers used in the system Flatness and noise figure for accurate testing. In the test, a multi-wavelength light source that accommodates all signal paths within the normal operating range of the optical amplifier and changes according to the actual number of paths is particularly important. The invention of the multi-wavelength signal source constituting device is proposed based on this background. [0003] One of the traditional multi-wavelen...

Claims

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Application Information

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IPC IPC(8): H04B10/071H04J14/02
Inventor 王占山
Owner ZTE CORP
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