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Back scatter detector for high kilovolt X-ray spot scan imaging system

An imaging system and X-ray technology, applied in the field of backscatter detectors, can solve the problems of low ray absorption efficiency, moisture-susceptible price, low areal density, etc., and achieve the effects of reducing afterglow, improving sensitivity, and improving conversion efficiency.

Active Publication Date: 2006-01-04
ZHONGDUNANMIN ANALYSIS TECH CO LTD BEIJING +1
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Problems solved by technology

Powder screens have low afterglow and high light conversion efficiency, but low surface density and low ray absorption efficiency; transparent crystals have high light conversion efficiency, high X-ray absorption efficiency, and good spectral matching, but large afterglow , easy to be affected by moisture or the price is extremely high, it is difficult to meet people's requirements

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  • Back scatter detector for high kilovolt X-ray spot scan imaging system
  • Back scatter detector for high kilovolt X-ray spot scan imaging system

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Embodiment Construction

[0012] Now in conjunction with the accompanying drawings, the structure and working principle of the present invention will be further described:

[0013] The invention is suitable for high kilovolt (300KeV-10MeV) X-ray point scanning imaging system.

[0014] as attached figure 1 As shown, the present invention adopts a truncated quadrangular pyramid structure, and a sealed shell is formed by the bottom surface of the cone, the top surface of the cone and the remaining four cone surfaces. The bottom surface of the cone is an incident window for X-rays, the outer layer is an aluminum-plastic plate 5, and the inner layer is a barium fluoride chloride screen 4. The aluminum-plastic plate 5 is composed of a polyethylene plate with a thickness of 2 to 5 mm and a thickness of 0.02 to 5 mm. Aluminum foil with a thickness of 0.04 mm; the aluminum-plastic plate 5 has high X-ray permeability, which not only seals light but also supports the barium fluoride chloride screen 4, and the ma...

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Abstract

The back scatter detector is one truncated rectangular pyramid structure comprising one bottom plane, one top plane and four side planes to form one sealed casing. The bottom plane as the X-ray incident window has outer layer of aluminum-plastic board and inner layer of barium fluorochloride screen; and the top plane and the four side planes have transparent flash cesium iodide crystal sheets adhered to the inner surface and mounted photomultipliers. The present invention has barium fluorochloride layer to absorb low energy X-rays and transparent cesium iodide crystal sheets to absorb high energy X-rays, and this can greatly reduce afterglow, raise the X-ray absorbing efficiency and raise light converting efficiency.

Description

technical field [0001] The invention relates to social public safety inspection equipment, in particular to a backscatter detector in a high kilovolt X-ray point scanning imaging system. Background technique [0002] Backscatter detectors used in currently known high-kilovolt (300KeV~10MeV) X-ray point scanning imaging systems all use scintillation materials to convert backscattered X-rays into visible light, and the visible light is transmitted to the photocathode of the photomultiplier tube and The photoelectron is shot out, and the photoelectron is amplified by the dynode to output an electrical signal. [0003] If you want to improve the backscatter detection sensitivity of X-rays, the backscatter detector must have a large enough receiving area. In this way, several pairs of backscatter detectors are arranged on both sides of the pencil beam of the general point scan imaging system, resulting in Huge, complex structure, high failure rate. [0004] In order to improve ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/203G01T1/00
Inventor 董国平黄校垣吴建义金川
Owner ZHONGDUNANMIN ANALYSIS TECH CO LTD BEIJING
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