Lithographic Apparatus and Device Manufacturing Method

a technology of lithographic apparatus and manufacturing method, which is applied in the direction of photomechanical apparatus, instruments, optics, etc., can solve the problems of affecting the final product quality, affecting the quality of final products, and affecting the straightness of substrates, so as to achieve the effect of substantially reducing the internal stresses of substrates due to clamping forces

Inactive Publication Date: 2009-04-02
ASML NETHERLANDS BV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0010]Applicants have determined that it is desirable to provide a substrate support having a holding arrangement for substrates, wherein internal stresses in a substrate due to clamping forces are substantially decreased. Furthermore, it is desirable to provide a clamping method with which a warped substrate may be clamped on a substrate support in a manner that does not introduce stresses in the substrate and / or the potential for overlay errors.

Problems solved by technology

However, substrates may not be straight.
However, as a result, stresses may be induced in the substrate when it is clamped on the supporting surface.
These stresses may adversely affect the final product quality.
The clamped forced re-shaping of the substrate may also adversely affect overlay performance of the projections of the lithographic apparatus in that they may not properly align thereby reducing product quality.

Method used

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  • Lithographic Apparatus and Device Manufacturing Method
  • Lithographic Apparatus and Device Manufacturing Method
  • Lithographic Apparatus and Device Manufacturing Method

Examples

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Embodiment Construction

[0021]FIG. 1 schematically depicts a lithographic apparatus according to one embodiment of the invention. The apparatus includes an illumination system (illuminator) IL configured to condition a radiation beam B (e.g., UV radiation or any other suitable radiation), a mask support structure (e.g., a mask table) MT constructed to support a patterning device (e.g., a mask) MA and connected to a first positioning device PM configured to accurately position the patterning device MA in accordance with certain parameters. The apparatus also includes a substrate table (e.g., a wafer table) WT or “substrate support” constructed to hold a substrate (e.g., a resist-coated wafer) W and connected to a second positioning device PW configured to accurately position the substrate W in accordance with certain parameters. The apparatus further includes a projection system (e.g., a refractive projection lens system) PS configured to project a pattern imparted to the radiation beam B by patterning devi...

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PUM

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Abstract

A clamping device can be configured to clamp an object on a support. The clamping device can include a first device configured to exert an attracting force on the object, and a second device configured to exert a rejecting force on the object. The first device and second device can be configured to simultaneously exert an attracting and a rejecting force on the object to shape the object to a desired shape before clamping of the object on the support. A method is provided for loading an object on a support, comprising the steps of shaping the object in a desired shape spaced from the support. The shaping can include subjecting the object simultaneously to an attracting force pulling the object toward the support and a rejecting force pushing the object away from the support, and clamping the object on the support.

Description

CROSS REFERENCE TO RELATED APPLICATIONS[0001]This application claims priority to U.S. Application 60 / 935,381 filed Aug. 9, 2007. The subject matter of that application is incorporated herein as if fully set forth.BACKGROUND[0002]1. Field of the Invention[0003]The present invention relates to a clamping device and a method for clamping an object on a support. The present invention further relates to a lithographic apparatus and a method for clamping a substrate on a substrate support of a lithographic apparatus.[0004]2. Description of the Related Art[0005]A lithographic apparatus is a machine that applies a desired pattern onto a substrate, usually onto a target portion of the substrate. A lithographic apparatus can be used, for example, in the manufacture of integrated circuits (ICs). In such a case, a patterning device, which is alternatively referred to as a mask or a reticle, may be used to generate a circuit pattern to be formed on an individual layer of the IC. This pattern can...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G03B27/60G03B27/32
CPCG03F7/707H01L21/6838H01L21/67288G03F7/70783
Inventor COMPEN, RENE THEODORUS PETRUSSMEETS, MARTIN FRANS PIERRE
Owner ASML NETHERLANDS BV
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