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Inverse baking deposition structure in chemical vapor deposition equipment for metal organic matter

A technology of chemical vapor deposition and metal organics, applied in the direction of gaseous chemical plating, metal material coating process, coating, etc., can solve the problems of accelerating raw material deposition, prolonging equipment downtime, reducing equipment service time, etc., to reduce raw materials Waste, avoid reaction chamber ceiling deposition, reduce downtime effect

Inactive Publication Date: 2009-07-08
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

These deposits have the following adverse effects: (i) the deposits 2 on the ceiling may fall off on the substrate 3 at any time, reducing the quality of the material; Downtime reduces equipment usage time; (iii) Accelerates the deposition of raw materials on the ceiling and consumes raw materials ineffectively
It is generally difficult to deposit raw materials directly on the ceiling of the reaction chamber, but once a layer of sediment grows on the ceiling of the reaction chamber, it is easy to grow more and thicker deposits on the ceiling in the future

Method used

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  • Inverse baking deposition structure in chemical vapor deposition equipment for metal organic matter
  • Inverse baking deposition structure in chemical vapor deposition equipment for metal organic matter
  • Inverse baking deposition structure in chemical vapor deposition equipment for metal organic matter

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Embodiment approach

[0028] (1) Movable baffle type—add one or more movable quartz baffles 6 in the reaction chamber. When growing materials, the movable quartz baffle 6 is removed or extracted from the reaction chamber; and when the graphite pedestal 4 is baked, the movable quartz baffle 6 is placed between the graphite pedestal 4 and the reaction chamber ceiling 1 to prevent the graphite pedestal from The volatiles on 4 are deposited on the ceiling 1.

[0029] (2) Movable ceiling type—the ceiling 1 of the reaction chamber is movable, and there are one or more pieces. If it is a plurality of reaction chamber ceilings, add one of them without sediment reaction chamber ceiling 1a when growing materials; and add another movable ceiling 1b when baking graphite base 4, the volatile matter on graphite base Deposited on this piece of ceiling 1b. The movable ceiling 1b may also not be added to the graphite base 4 during baking, and the reaction chamber may be opened to volatilize the deposits on the gr...

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Abstract

For metal organic chemical vapor deposition (MOCVD) equipment, especially production metal organic chemical vapor deposition equipment, during the process of baking the graphite base after growing the material, the deposits in the reaction chamber, especially the deposits on the graphite base, are heated When the evaporation rises to the ceiling of the reaction chamber, the graphite deposit will be cooled and deposited on the ceiling again due to the temperature difference. Deposits on these ceilings have the detrimental effect of reducing epiwafer quality, prolonging the cleaning and downtime required for MOCVD equipment, and wasting raw materials. The invention provides an anti-baking deposition structure, which can effectively avoid the reaction chamber ceiling deposition caused by baking the graphite base. The invention reduces the deposition of raw materials on the ceiling of the reaction chamber, reduces the loss of raw materials, reduces the downtime of equipment, and improves the use efficiency of equipment.

Description

technical field [0001] The invention relates to the field of semiconductor equipment manufacturing, in particular to the anti-baking deposition structure in MOCVD equipment. Background technique [0002] Metal-organic chemical vapor deposition (MOCVD) was first proposed in the 1960s, developed in the 1970s to 1980s, and has become the core growth technology for the preparation of optoelectronic materials such as gallium arsenide and indium phosphide in the 1990s. At present, it has been widely used in the production of optoelectronic materials and devices such as gallium arsenide and indium phosphide. At the same time, metal-organic chemical vapor deposition (MOCVD) is the mainstream method for preparing GaN light-emitting diodes and laser diode epitaxial wafers. From the perspective of the main indicators such as the performance of the grown GaN epitaxial wafers and devices, and production costs, there is no other method. can be compared with it. [0003] The principle of...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C23C16/00
Inventor 刘祥林焦春美
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI