Scanning electron microscope electron back scattering diffraction in-situ stretching device and measuring method

Abstract

The invention discloses a normal position stretching device of backscatter and diffraction of scanning electron microscope electron back and a test method, belonging to the material structure and capability normal position test field. The prior art is hard to be applied to the all-in-one test of the normal position microstructure and capability. The device comprises a base, a support and a drive part, a sample holding part, and a test part for stretching displacement and load. Wherein, the support part includes a fixed baffle I (4) and a fixed baffle II (14); the base (1) is sequentially provided with a sliding baffle (13), a displacing slider (8) and a stress slider (7); a pair of slide bars are fixed onto the base (1); the drive part includes a straight-line motor displacement driver (2); the sample holding part includes a loaded clamp (10) and a fixed clamp (6); and the test part for stretching displacement and load part includes a stress sensor (5), a displacement sensor (11) and a computer data collection and process system. The device provides simple structure and reliable capability, leads material mechanical property to be corresponding to the microstructure for discovering outstanding mechanical property and deformation mechanism.

Description

technical field [0001] The invention relates to a device installed in a scanning electron microscope for in-situ dynamic mechanical property testing, microscopic deformation appearance and crystal orientation observation of various solid materials. It can directly correspond the microscopic deformation mechanism and mechanical properties of various materials, and belongs to the field of in-situ testing of material structure and performance. Background technique: [0002] The macroscopic mechanical behavior of materials is a concrete manifestation of material properties and microstructure, and its mechanical performance parameters are the basic basis for the safety and reliability design of structural materials during service. Studying the microscopic deformation mechanism of materials has important theoretical significance and engineering application value for understanding the mechanical properties of materials, optimizing structural design, and developing new materials and...

AI Technical Summary

Problems solved by technology

These measurements can no longer meet the needs of current material development, especially some structural materials with micro-nano structures, such as nanocrystalline materials, thin film materials, etc.

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