Double-beam multi-functional z scanning optical non-linear measuring device and method

A technology of optical nonlinearity and measuring devices, applied in the field of nonlinear optics, can solve the problems of inaccurate and inconvenient data

Inactive Publication Date: 2010-08-18
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

However, this method can only measure the nonlinear properties of transparent samples; because it is difficult to judge whether the surface morphology of the material has changed, this leads to the inability to confirm whether the nonlinearity of the material comes from the intrinsic effect caused by the laser or the material itself caused by the laser structural changes; and, when it is necessary to study the nonlinear properties of materials under different light sources, it is inconvenient to re-adjust the optical path; more importantly, due to ignoring the reflected light information from the sample, the conventional transmission z -scan method is inaccurate when measuring opaque samples or translucent samples, and even the obtained nonlinear refraction and nonlinear absorption coefficients are opposite to the actual ones

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Embodiment Construction

[0048] The present invention will be further described below in conjunction with embodiment and accompanying drawing, but should not limit protection scope of the present invention with this:

[0049] see first figure 1 , figure 1 It is an optical path structure diagram of an embodiment of the dual-beam multi-functional z-scan optical nonlinear measurement device realized by the present invention. It can be seen from the figure that the dual-beam multi-functional z-scan optical nonlinear measurement device of the present invention is composed of an output laser wavelength λ 1 The first laser 1 and the output laser wavelength λ 2 The second laser 5, along the main optical path of the laser output of the first laser 1 are the first valve 32, the first acousto-optic modulator 3, the laser beam splitter 6, the first adjustable attenuation plate 7, the first An aperture diaphragm 8, a beam expander 9, a first dichroic prism 10, a second dichroic prism 13, an objective lens 17, a ...

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Abstract

The invention discloses a double-beam multi-functional z scanning optical non-linear measuring device and a double-beam multi-functional z scanning optical non-linear measuring device method. The device uses two light sources and can conveniently switch the light sources; an adjustable attenuation slice is adopted, so laser power is continuously adjustable from 0 and 100 percent; an acoustic optical modulator and a signal generator are adopted, so the pulse width and pulse period of emergent laser are adjustable; and transmission open hole and transmission closed hole data of a sample can be measured and reflecting open hole and transmission open hole data of the sample can also be measured. The device and the method not only can measure nonlinear absorption coefficient and nonlinear refractive index of a transparent sample, but also can measure nonlinear refractive index of a nontransparent sample; and a cold light source serving as an illumination light source is added into the device, a CCD camera is used for observing surface appearance of the sample and an optical filter is used for filtering the effect of the laser, so the measuring accuracy and correctness of the nonlinear absorption coefficient and nonlinear refractive index of the transparent sample and a partially transparent sample are enhanced.

Description

technical field [0001] The invention relates to nonlinear optics, in particular to a double-beam multifunctional z-scan optical nonlinear measurement device and method, which is practical and feasible, simple in data processing and convenient in observation. Background technique [0002] In recent years, people try to develop all-optical devices with good performance to meet the urgent needs of all-optical communication and optical information processing, and the corresponding nonlinear optical materials have been greatly developed. At present, the methods for measuring the nonlinear coefficient of materials mainly include degenerate four-wave mixing method, double-wave coupling method, ellipsometry, beam distortion method and optical Kerr effect method (see prior art [1] Yang Hailin, Niu Yanxiong, Shen Xueju, etc. .Research progress and application of laser z-scanning technology[J].Journal of Ordnance Engineering College, 2007,19(5):50-54), these methods are complicated in ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/31G01N21/41G01B11/24
Inventor 马晓晴魏劲松
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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