Reflective polarizing element and method for improving linear polarization degree of soft X-rays

A polarizing element and reflective technology, which is applied in the field of reflective polarizing elements, can solve the problems of complex preparation and application process, great manpower and material resources consumption, avoid film system design and complicated process preparation process, and simplify the experimental operation process , the effect of a wide range of sources
CN101937730BInactive Publication Date: 2012-09-05BEIJING TECHNOLOGY AND BUSINESS UNIVERSITY
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
BEIJING TECHNOLOGY AND BUSINESS UNIVERSITY
Publication Date
2012-09-05
Estimated Expiration
Not applicable · inactive patent

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Abstract

The invention discloses a reflective polarizing element and a method for improving the linear polarization degree of soft X-rays. The polarizing element is a reflective polarizing chip made of artificial crystals; and the reflective polarizing chip has a polished reflective mirror surface. The method for improving the linear polarization degree of the soft X-rays is to obtain high linear polarization degree soft X-rays through artificial crystal chip in a 50 to 180eV ergoregion. The method can avoid troubles in design and complex process preparation I the prior art and use the new reflective polarizing element to obtain the high linear polarization degree soft X-rays.
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Description

technical field

[0001] The present invention relates to a reflective polarizing element and method for increasing the degree of linear polarization of soft X-rays. Background technique

[0002] Polarization is one of the excellent properties of synchrotron radiation sources. In recent years, the application research of soft X-ray polarization using materials (especially magnetic materials and living matter) on the changes of the polarization intensity and polarization state of incident soft X-rays has been widely used in the fields of biology, chemistry, physics, materials science, and metrology. Carried out and developed many valuable measurement methods for studying the magnetic properties of materials, such as soft X-ray magnetic circular dichroism (XMCD), magnetic line dichroism (XMLD), magneto-optical Faraday effect and Kerr (Kerr) effect etc. In these studies, it is extremely important to accurately determine the polarization state of incident soft X-rays.

[0003] ...

Claims

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