Low-heat-resistance packaging structure of power MOS (Metal Oxide Semiconductor) device
A technology of MOS device and packaging structure, which is applied to electric solid-state devices, semiconductor devices, semiconductor/solid-state device components, etc. Form differences and other issues, to achieve the effect of reducing body inductance, reducing thermal resistance, and reducing thermal resistance
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[0019] A low thermal resistance package structure for power MOS devices, such as image 3 As shown, it includes a power MOS device, a metal heat sink, a package shell, and external pins for the gate, source and drain. The surface of the metal heat sink has a thin layer of insulating oxide; the surface of the thin layer of insulating oxide has gate, source and drain metal pads corresponding to the gate, source and drain of the power MOS device, respectively; and the power MOS device Flip-chip on the thin insulating oxide surface of the metal heat sink; the gate, source and drain of the power MOS device are respectively welded to the gate, source and drain metal pads on the thin insulating oxide surface; thin The gate, source, and drain metal pads on the surface of the insulating oxide layer are connected to the external pins of the gate, source, and drain respectively; the package shell is installed outside the power MOS device to realize the isolation of the power MOS device fro...
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