Detection method capable of reducing background influence based on waveguide coupling surface plasma resonance
A technology of surface plasmon and detection method, applied in the measurement of scattering characteristics, etc., can solve the problem of inability to distinguish surface plasmon resonance conditions, and achieve the effect of accurate and reliable measurement results, easy to grasp, and elimination of background layer interference.
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[0031] figure 2 A schematic diagram of an example of a sensing layer structure according to the content of the present invention is given. A triangular prism is used as the optical coupling element. The waveguide structure is composed of the metal thin film 1, the metal thin film 2 and the dielectric layer. The design of the waveguide structure satisfies the condition that the sensitivities of the waveguide coupling surface plasmon resonance peak and the selected reference peak are not the same, and satisfies the condition of formula (1). The waveguide-coupled surface plasmon resonance detection system in this example is mainly composed of light source, waveguide-coupled surface plasmon resonance sensing and detection components, and data acquisition and processing devices, including:
[0032] Light source: a monochromatic light source with a wavelength of 980nm, the purpose is to obtain a fixed single-wavelength incident light;
[0033] Optical path components: including ...
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Abstract
Description
Claims
Application Information
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