Spectroscopic imaging system of flat-field imaging spectrometer

An imaging spectrometer and imaging system technology, applied in spectrometry/spectrophotometry/monochromator, color/spectral characteristic measurement, instrument, etc., can solve system processing and assembly difficulties, long processing and assembly cycle, image Quality impact and other issues, to achieve the effect of easy installation and debugging, simple structure, and small geometric aberration

Inactive Publication Date: 2012-01-25
SUZHOU UNIV
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Problems solved by technology

[0004] At present, the Offner-type imaging spectrometer introduced in the existing reports, such as the design results reported by John Fisher, X. Prieto-Blanco, etc., mostly adopts an off-axis three-reflection structure, that is, the main mirror, the grating, and the three mirrors are three pieces. Independent components to obtain a large relative aperture, this type of system processing and assembly is more difficult, the slight tilt and eccentricity of the mirror will have a serious impact on the image quality of the system, and its processing and assembly cycle is longer

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  • Spectroscopic imaging system of flat-field imaging spectrometer
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  • Spectroscopic imaging system of flat-field imaging spectrometer

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Embodiment 2

[0035] The F-number of the spectroscopic imaging system in this embodiment is F / # =3.0, and the operating wavelength is 1.0 μm to 2.5 μm in the short-wave infrared band. For the structure of the optical imaging system, refer to Embodiment 1.

[0036] The remaining parameters of the spectroscopic imaging system are as follows: the incident slit is a rectangle with a length of 30 mm and a width of 30 μm, and the grating constant is 52 lp / mm. The focal length of the system is 1640mm, the radius of curvature of the concave mirror is -188mm, and the radius of curvature of the grating is -95mm. When normalized relative to the focal length of the lens, the radius of curvature is R 1=-0.115, R 2 =-0.058. The distance between the incident slit 5 and the concave mirror 1 is 188 mm, the distance between the concave mirror 1 and the convex grating 2 is 93 mm, and the distance between the concave mirror and the image plane is 188 mm.

[0037] The spectroscopic imaging of the flat image ...

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Abstract

The invention discloses a spectroscopic imaging system of a flat-field imaging spectrometer, in particular to a spectroscopic imaging system of a large-relative aperture flat-field Offner type imaging spectrometer. The system comprises a concave surface reflecting mirror and a convex surface grating which are fully spherical elements and have coaxial concentric structures; object planes and image planes of the system are positioned on a sagittal flat-field curve of the system; large-relative aperture flat-field imaging can be realized by adjusting the curvature radius of the grating; the system meets telecentric requirements of an object side and an image side; and thus, the image plane has uniform luminance and good imaging quality and is suitable for an air-borne or satellite-borne imaging spectrometer optical system. The system also has the advantages of simple structure, high stability, small geometric image difference, easiness in mounting and debugging, easiness in processing and the like; the production cost can be greatly lowered; and the system is suitable for batch production.

Description

technical field [0001] The invention relates to a spectroscopic imaging system of an imaging spectrometer, in particular to a spectroscopic imaging system for an airborne or spaceborne large relative aperture flat image field Offner imaging spectrometer. Background technique [0002] The imaging spectrometer organically combines imaging technology and spectral technology to achieve the integration of maps. By obtaining the two-dimensional spatial information and one-dimensional spectral information of the target, the shape and spectral characteristics of the object can be obtained, which can be used to identify the type of object , to identify material components, etc. Since the concept of the imaging spectrometer was proposed in the 1970s, it has been developed rapidly. It has a wide range of applications in remote sensing fields such as land resource survey, agriculture, forestry and environmental monitoring. [0003] Offner-type imaging spectrometer has the advantages o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/02G01J3/28G01B11/24G01N21/25G02B27/10G02B17/02
Inventor 沈为民薛汝东季轶群袁颖华
Owner SUZHOU UNIV
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