Near-field needle-point reinforced photoionization ion source

A technology of photoionization and ion source, which is applied in the field of ion source to achieve the effect of high spatial resolution and low sample consumption

Inactive Publication Date: 2012-02-01
XIAMEN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in the fields of microelectronics, supramolecular chemistry, and living single-cell imaging, nanoscale fine structure analysis has attracted more and more attention, and imaging technology based on far-field laser focusing has been applied in these fields. has great limitations

Method used

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  • Near-field needle-point reinforced photoionization ion source
  • Near-field needle-point reinforced photoionization ion source

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Embodiment Construction

[0021] The following embodiments will further illustrate the present invention in conjunction with the accompanying drawings.

[0022] see figure 1 , the embodiment of the present invention is provided with light source, needle point 2, ion sampling device 3 and solid sample 4; The light beam 1 that described light source sends is irradiated on the surface of solid sample 4 after needle point 2, and the sampling hole of ion sampling device 3 and solid sample The distance between the surfaces of 4 is 0.1-50 mm. The output terminal of the ion sampling device 3 is connected to the mass analyzer of the mass spectrometer, and the mass analyzer of the mass spectrometer obtains a spectrum containing the information of the measured solid sample 4 .

[0023] The light source can be a continuous light source or a pulsed light source, the beam wavelength of the continuous light source can be 157-1100nm, the average power can be > 0.1mW, and the beam diameter can be 0.1-10mm; the beam wav...

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Abstract

The invention provides a near-field needle-point reinforced photoionization ion source, relating to an ion source of a mass spectrometer. The ion source comprises a light source, a needle point, solid samples and an ion sampling device, wherein beams sent by the light source pass through the needle point and then radiate the surface of the solid samples; and the distance between a sampling hole of the ion sampling device and the surface of the solid samples is 0.1-50mm, an output end of the ion sampling device is connected with a mass analyzer of the mass spectrometer, and the mass analyzer of the mass spectrometer acquires a spectrogram with the information of the tested solid samples. By using the near-field needle-point reinforced photoionization ion source, the space resolution of microanalysis is high, the deep analysis of the thickness of a molecular layer (or atom layer) can be realized, the sample consumption is low, and the analysis of almost all solid samples can be realized.

Description

technical field [0001] The invention relates to an ion source of a mass spectrometer, in particular to a near-field needle tip enhanced photoionization ion source. Background technique [0002] In modern analysis, the analysis of solid samples is very common, especially in metallurgy, environmental monitoring, geological research, space exploration and other fields. With the development of science and technology and the continuous improvement of people's detection requirements, the traditional solution analysis method based on sample digestion has been gradually replaced by some new solid direct analysis techniques, and related research has become a development of analytical science in recent years. hotspot. Among the many direct solid analysis methods, laser sampling technology is widely used due to its advantages of fast analysis speed, low sample consumption and no need for sample pretreatment. The laser sputtering inductively coupled plasma mass spectrometry (Laser Abl...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/16
Inventor 杭纬
Owner XIAMEN UNIV
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